Analysis of different measurements setups for a programmable Josephson voltage standard

R. Behr; J. Kohlmann; J.T. Janssen; P. Kleinschmidt; J.M. Williams; J.-P. Lo-Hive; F. Piquemal; P.O. Hetland; D. Reymann; G. Ecklund; C. Hof; B. Jeanneret; O. Chevtchenko; Ernest Houtzager; H. van den Brom; A. Sosso; D. Andreone; Jari Penttilä; Panu Helistö

doi:10.1109/CPEM.2002.1034886

Analysis of different measurements setups for a programmable Josephson voltage standard

R. Behr
, J. Kohlmann
, J.T. Janssen
, P. Kleinschmidt
, J.M. Williams
, J.-P. Lo-Hive
, F. Piquemal
, P.O. Hetland
, D. Reymann
, G. Ecklund
, C. Hof
, B. Jeanneret
, O. Chevtchenko
, Ernest Houtzager
, H. van den Brom
, A. Sosso
, D. Andreone
, Jari Penttilä
, Panu Helistö

German National Metrology Institute (PTB)
Norwegian Metrology Service
VTT (former employee or external)
Istituto Elettrotecnico Nazionale Galileo Ferraris
Centre for Metrology and Accreditation Finland (MIKES)
National Physics Laboratory (NPL)
Bureau National de Métrologie (BNM)
Bureau International des Poids et Mesures (BIPM)
RISE Research Institutes of Sweden
Federal Institute of Metrology (METAS)
Dutch Metrology Institute (VSL)

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

Various operational parameters of two different I-V binary programmable Josephson arrays are evaluated and compared within different Josephson array voltage standard (JAVS) set-ups at microwave frequencies around 70 GHz. For this purpose, the investigation of the electrical characteristics of a SINIS-type Josephson array and of an externally shunted SIS-type Josephson array is under way at ten national metrology institutes. The results of the measurements are presented and discussed.

Original language	English
Title of host publication	2002 Conference on Precision Electromagnetic Measurements Conference Digest
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	390-391
ISBN (Print)	978-0-7803-7242-9
DOIs	https://doi.org/10.1109/CPEM.2002.1034886
Publication status	Published - 2002
MoE publication type	A4 Article in a conference publication
Event	Conference on Precision Electromagnetic Measurements, CPEM 2002 - Ottawa, Canada Duration: 16 Jun 2002 → 21 Jun 2002

Conference

Conference	Conference on Precision Electromagnetic Measurements, CPEM 2002
Country/Territory	Canada
City	Ottawa
Period	16/06/02 → 21/06/02

Access to Document

10.1109/CPEM.2002.1034886

Analysis of different measurement setups for a programmable Josephson voltage standard
Behr, R., Kohlmann, J., Janssen, J.-T. B. M., Kleinschmidt, P., Williams, J. M., Djordjevic, S., Lo-Hive, J.-P., Piquemal, F., Hetland, P.-O., Reymann, D., Eklund, G., Hof, C., Jeanneret, B., Chevtchenko, O., Houtzager, E., van den Brom, H. E., Sosso, A., Andreone, D., Nissilä, J. & Helistö, P., 2003, In: IEEE Transactions on Instrumentation and Measurement. 52, 2, p. 524-528
Research output: Contribution to journal › Article › Scientific › peer-review
19 Link opens in a new tab Citations (Scopus)

Cite this

Behr, R., Kohlmann, J., Janssen, J. T., Kleinschmidt, P., Williams, J. M., Lo-Hive, J.-P., Piquemal, F., Hetland, P. O., Reymann, D., Ecklund, G., Hof, C., Jeanneret, B., Chevtchenko, O., Houtzager, E., van den Brom, H., Sosso, A., Andreone, D., Penttilä, J., & Helistö, P. (2002). Analysis of different measurements setups for a programmable Josephson voltage standard. In 2002 Conference on Precision Electromagnetic Measurements Conference Digest (pp. 390-391). Article WeE3 IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/CPEM.2002.1034886

@inproceedings{1a0848f9a9d54748a5c9c6b6b2d19b40,

title = "Analysis of different measurements setups for a programmable Josephson voltage standard",

abstract = "Various operational parameters of two different I-V binary programmable Josephson arrays are evaluated and compared within different Josephson array voltage standard (JAVS) set-ups at microwave frequencies around 70 GHz. For this purpose, the investigation of the electrical characteristics of a SINIS-type Josephson array and of an externally shunted SIS-type Josephson array is under way at ten national metrology institutes. The results of the measurements are presented and discussed.",

author = "R. Behr and J. Kohlmann and J.T. Janssen and P. Kleinschmidt and J.M. Williams and J.-P. Lo-Hive and F. Piquemal and P.O. Hetland and D. Reymann and G. Ecklund and C. Hof and B. Jeanneret and O. Chevtchenko and Ernest Houtzager and \{van den Brom\}, H. and A. Sosso and D. Andreone and Jari Penttil{\"a} and Panu Helist{\"o}",

year = "2002",

doi = "10.1109/CPEM.2002.1034886",

language = "English",

isbn = "978-0-7803-7242-9",

pages = "390--391",

booktitle = "2002 Conference on Precision Electromagnetic Measurements Conference Digest",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "Conference on Precision Electromagnetic Measurements, CPEM 2002 ; Conference date: 16-06-2002 Through 21-06-2002",

}

Behr, R, Kohlmann, J, Janssen, JT, Kleinschmidt, P, Williams, JM, Lo-Hive, J-P, Piquemal, F, Hetland, PO, Reymann, D, Ecklund, G, Hof, C, Jeanneret, B, Chevtchenko, O, Houtzager, E, van den Brom, H, Sosso, A, Andreone, D, Penttilä, J & Helistö, P 2002, Analysis of different measurements setups for a programmable Josephson voltage standard. in 2002 Conference on Precision Electromagnetic Measurements Conference Digest., WeE3, IEEE Institute of Electrical and Electronic Engineers, pp. 390-391, Conference on Precision Electromagnetic Measurements, CPEM 2002, Ottawa, Ontario, Canada, 16/06/02. https://doi.org/10.1109/CPEM.2002.1034886

Analysis of different measurements setups for a programmable Josephson voltage standard. / Behr, R.; Kohlmann, J.; Janssen, J.T. et al.
2002 Conference on Precision Electromagnetic Measurements Conference Digest. IEEE Institute of Electrical and Electronic Engineers, 2002. p. 390-391 WeE3.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Analysis of different measurements setups for a programmable Josephson voltage standard

AU - Behr, R.

AU - Kohlmann, J.

AU - Janssen, J.T.

AU - Kleinschmidt, P.

AU - Williams, J.M.

AU - Lo-Hive, J.-P.

AU - Piquemal, F.

AU - Hetland, P.O.

AU - Reymann, D.

AU - Ecklund, G.

AU - Hof, C.

AU - Jeanneret, B.

AU - Chevtchenko, O.

AU - Houtzager, Ernest

AU - van den Brom, H.

AU - Sosso, A.

AU - Andreone, D.

AU - Penttilä, Jari

AU - Helistö, Panu

PY - 2002

Y1 - 2002

N2 - Various operational parameters of two different I-V binary programmable Josephson arrays are evaluated and compared within different Josephson array voltage standard (JAVS) set-ups at microwave frequencies around 70 GHz. For this purpose, the investigation of the electrical characteristics of a SINIS-type Josephson array and of an externally shunted SIS-type Josephson array is under way at ten national metrology institutes. The results of the measurements are presented and discussed.

AB - Various operational parameters of two different I-V binary programmable Josephson arrays are evaluated and compared within different Josephson array voltage standard (JAVS) set-ups at microwave frequencies around 70 GHz. For this purpose, the investigation of the electrical characteristics of a SINIS-type Josephson array and of an externally shunted SIS-type Josephson array is under way at ten national metrology institutes. The results of the measurements are presented and discussed.

U2 - 10.1109/CPEM.2002.1034886

DO - 10.1109/CPEM.2002.1034886

M3 - Conference article in proceedings

SN - 978-0-7803-7242-9

SP - 390

EP - 391

BT - 2002 Conference on Precision Electromagnetic Measurements Conference Digest

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - Conference on Precision Electromagnetic Measurements, CPEM 2002

Y2 - 16 June 2002 through 21 June 2002

ER -

Analysis of different measurements setups for a programmable Josephson voltage standard

Abstract

Conference

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Research output

Analysis of different measurement setups for a programmable Josephson voltage standard

Cite this