TY - JOUR
T1 - Analysis of retained deuterium on Be-based films
T2 - Ion implantation vs. in-situ loading
AU - Mateus, Rodrigo
AU - Porosnicu, Corneliu
AU - Lungu, Cristian Petricǎ
AU - Cruz, C.
AU - Siketić, Zdravko
AU - Radović, Iva Bogdanović
AU - Hakola, Antti
AU - Alves, Eduardo
AU - WP PFC contributors
N1 - Funding Information:
This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 under grant agreement number 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission . Work performed under EUROfusion WP PFC . IST also received financial support from " Fundação para a Ciência e a Tecnologia " through project UID/FIS/50010/2013 .
Funding Information:
This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 under grant agreement number 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission. Work performed under EUROfusion WP PFC. IST also received financial support from “Fundação para a Ciência e a Tecnologia” through project UID/FIS/50010/2013.
Publisher Copyright:
© 2018
Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2018/12
Y1 - 2018/12
N2 - Pure Be, Be-O and Be-O-C thin coatings were deposited using high-power impulse magnetron sputtering (HiPIMS) with and without incorporation of deuterium. The coatings produced without deuterium were implanted afterwards with 15 keV 2H+ ion beams with a fluence limited to 2 × 1017 ion/cm2 in order to mitigate the damage imposed by ion irradiation and prevent a fast gas release. The as-deposited and as-implanted coatings were analysed by IBA techniques, namely by elastic and Rutherford backscattering spectrometries (EBS and RBS, respectively), nuclear reaction analysis (NRA) and by time-of-flight elastic recoil detection analysis (ToF-ERDA). Despite distinct deuterium depth profiles in the implanted samples, the results show that for the present ion implantation and deposition parameters, similar retained amounts are revealed in the films loaded by ion implantation or during the HiPIMS deposition, assuring ion implantation as a competitive and reliable method for fuel incorporation in thin Be-based films for retention studies in controlled conditions.
AB - Pure Be, Be-O and Be-O-C thin coatings were deposited using high-power impulse magnetron sputtering (HiPIMS) with and without incorporation of deuterium. The coatings produced without deuterium were implanted afterwards with 15 keV 2H+ ion beams with a fluence limited to 2 × 1017 ion/cm2 in order to mitigate the damage imposed by ion irradiation and prevent a fast gas release. The as-deposited and as-implanted coatings were analysed by IBA techniques, namely by elastic and Rutherford backscattering spectrometries (EBS and RBS, respectively), nuclear reaction analysis (NRA) and by time-of-flight elastic recoil detection analysis (ToF-ERDA). Despite distinct deuterium depth profiles in the implanted samples, the results show that for the present ion implantation and deposition parameters, similar retained amounts are revealed in the films loaded by ion implantation or during the HiPIMS deposition, assuring ion implantation as a competitive and reliable method for fuel incorporation in thin Be-based films for retention studies in controlled conditions.
KW - Beryllium coatings
KW - Deuterium
KW - HiPIMS
KW - Ion implantation
UR - http://www.scopus.com/inward/record.url?scp=85056714229&partnerID=8YFLogxK
U2 - 10.1016/j.nme.2018.10.007
DO - 10.1016/j.nme.2018.10.007
M3 - Article
AN - SCOPUS:85056714229
SN - 2352-1791
VL - 17
SP - 242
EP - 247
JO - Nuclear Materials and Energy
JF - Nuclear Materials and Energy
ER -