Analysis of retained deuterium on Be-based films: Ion implantation vs. in-situ loading

Rodrigo Mateus; Corneliu Porosnicu; Cristian Petricǎ Lungu; C. Cruz; Zdravko Siketić; Iva Bogdanović Radović; Antti Hakola; Eduardo Alves; WP PFC Team

doi:10.1016/j.nme.2018.10.007

Analysis of retained deuterium on Be-based films: Ion implantation vs. in-situ loading

Rodrigo Mateus
, Corneliu Porosnicu
, Cristian Petricǎ Lungu
, C. Cruz
, Zdravko Siketić
, Iva Bogdanović Radović
, Antti Hakola
, Eduardo Alves
, WP PFC Team

Universidade de Lisboa
National Institute for Lasers, Plasma and Radiation Physics (INFLPR)
Ruđer Bošković Institute (IRB)

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)

Abstract

Pure Be, Be-O and Be-O-C thin coatings were deposited using high-power impulse magnetron sputtering (HiPIMS) with and without incorporation of deuterium. The coatings produced without deuterium were implanted afterwards with 15 keV ²H⁺ ion beams with a fluence limited to 2 × 10¹⁷ ion/cm² in order to mitigate the damage imposed by ion irradiation and prevent a fast gas release. The as-deposited and as-implanted coatings were analysed by IBA techniques, namely by elastic and Rutherford backscattering spectrometries (EBS and RBS, respectively), nuclear reaction analysis (NRA) and by time-of-flight elastic recoil detection analysis (ToF-ERDA). Despite distinct deuterium depth profiles in the implanted samples, the results show that for the present ion implantation and deposition parameters, similar retained amounts are revealed in the films loaded by ion implantation or during the HiPIMS deposition, assuring ion implantation as a competitive and reliable method for fuel incorporation in thin Be-based films for retention studies in controlled conditions.

Original language	English
Pages (from-to)	242-247
Journal	Nuclear Materials and Energy
Volume	17
DOIs	https://doi.org/10.1016/j.nme.2018.10.007
Publication status	Published - Dec 2018
MoE publication type	Not Eligible

Funding

This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 under grant agreement number 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission . Work performed under EUROfusion WP PFC . IST also received financial support from " Fundação para a Ciência e a Tecnologia " through project UID/FIS/50010/2013 .

Keywords

Beryllium coatings
Deuterium
HiPIMS
Ion implantation

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10.1016/j.nme.2018.10.007

Cite this

@article{08a0b33b76be437d8069b33e9ec04913,

title = "Analysis of retained deuterium on Be-based films: Ion implantation vs. in-situ loading",

abstract = "Pure Be, Be-O and Be-O-C thin coatings were deposited using high-power impulse magnetron sputtering (HiPIMS) with and without incorporation of deuterium. The coatings produced without deuterium were implanted afterwards with 15 keV 2H+ ion beams with a fluence limited to 2 × 1017 ion/cm2 in order to mitigate the damage imposed by ion irradiation and prevent a fast gas release. The as-deposited and as-implanted coatings were analysed by IBA techniques, namely by elastic and Rutherford backscattering spectrometries (EBS and RBS, respectively), nuclear reaction analysis (NRA) and by time-of-flight elastic recoil detection analysis (ToF-ERDA). Despite distinct deuterium depth profiles in the implanted samples, the results show that for the present ion implantation and deposition parameters, similar retained amounts are revealed in the films loaded by ion implantation or during the HiPIMS deposition, assuring ion implantation as a competitive and reliable method for fuel incorporation in thin Be-based films for retention studies in controlled conditions.",

keywords = "Beryllium coatings, Deuterium, HiPIMS, Ion implantation",

author = "Rodrigo Mateus and Corneliu Porosnicu and Lungu, \{Cristian Petricǎ\} and C. Cruz and Zdravko Siketi{\'c} and Radovi{\'c}, \{Iva Bogdanovi{\'c}\} and Antti Hakola and Eduardo Alves and \{WP PFC Team\}",

note = "Funding Information: This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 under grant agreement number 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission . Work performed under EUROfusion WP PFC . IST also received financial support from {"} Funda{\c c}{\~a}o para a Ci{\^e}ncia e a Tecnologia {"} through project UID/FIS/50010/2013 . Funding Information: This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 under grant agreement number 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission. Work performed under EUROfusion WP PFC. IST also received financial support from “Funda{\c c}{\~a}o para a Ci{\^e}ncia e a Tecnologia” through project UID/FIS/50010/2013. Publisher Copyright: {\textcopyright} 2018 Copyright: Copyright 2018 Elsevier B.V., All rights reserved.",

year = "2018",

month = dec,

doi = "10.1016/j.nme.2018.10.007",

language = "English",

volume = "17",

pages = "242--247",

journal = "Nuclear Materials and Energy",

issn = "2352-1791",

publisher = "Elsevier",

}

TY - JOUR

T1 - Analysis of retained deuterium on Be-based films

T2 - Ion implantation vs. in-situ loading

AU - Mateus, Rodrigo

AU - Porosnicu, Corneliu

AU - Lungu, Cristian Petricǎ

AU - Cruz, C.

AU - Siketić, Zdravko

AU - Radović, Iva Bogdanović

AU - Hakola, Antti

AU - Alves, Eduardo

AU - WP PFC Team

N1 - Funding Information: This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 under grant agreement number 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission . Work performed under EUROfusion WP PFC . IST also received financial support from " Fundação para a Ciência e a Tecnologia " through project UID/FIS/50010/2013 . Funding Information: This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 under grant agreement number 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission. Work performed under EUROfusion WP PFC. IST also received financial support from “Fundação para a Ciência e a Tecnologia” through project UID/FIS/50010/2013. Publisher Copyright: © 2018 Copyright: Copyright 2018 Elsevier B.V., All rights reserved.

PY - 2018/12

Y1 - 2018/12

N2 - Pure Be, Be-O and Be-O-C thin coatings were deposited using high-power impulse magnetron sputtering (HiPIMS) with and without incorporation of deuterium. The coatings produced without deuterium were implanted afterwards with 15 keV 2H+ ion beams with a fluence limited to 2 × 1017 ion/cm2 in order to mitigate the damage imposed by ion irradiation and prevent a fast gas release. The as-deposited and as-implanted coatings were analysed by IBA techniques, namely by elastic and Rutherford backscattering spectrometries (EBS and RBS, respectively), nuclear reaction analysis (NRA) and by time-of-flight elastic recoil detection analysis (ToF-ERDA). Despite distinct deuterium depth profiles in the implanted samples, the results show that for the present ion implantation and deposition parameters, similar retained amounts are revealed in the films loaded by ion implantation or during the HiPIMS deposition, assuring ion implantation as a competitive and reliable method for fuel incorporation in thin Be-based films for retention studies in controlled conditions.

AB - Pure Be, Be-O and Be-O-C thin coatings were deposited using high-power impulse magnetron sputtering (HiPIMS) with and without incorporation of deuterium. The coatings produced without deuterium were implanted afterwards with 15 keV 2H+ ion beams with a fluence limited to 2 × 1017 ion/cm2 in order to mitigate the damage imposed by ion irradiation and prevent a fast gas release. The as-deposited and as-implanted coatings were analysed by IBA techniques, namely by elastic and Rutherford backscattering spectrometries (EBS and RBS, respectively), nuclear reaction analysis (NRA) and by time-of-flight elastic recoil detection analysis (ToF-ERDA). Despite distinct deuterium depth profiles in the implanted samples, the results show that for the present ion implantation and deposition parameters, similar retained amounts are revealed in the films loaded by ion implantation or during the HiPIMS deposition, assuring ion implantation as a competitive and reliable method for fuel incorporation in thin Be-based films for retention studies in controlled conditions.

KW - Beryllium coatings

KW - Deuterium

KW - HiPIMS

KW - Ion implantation

UR - https://www.scopus.com/pages/publications/85056714229

U2 - 10.1016/j.nme.2018.10.007

DO - 10.1016/j.nme.2018.10.007

M3 - Article

AN - SCOPUS:85056714229

SN - 2352-1791

VL - 17

SP - 242

EP - 247

JO - Nuclear Materials and Energy

JF - Nuclear Materials and Energy

ER -

Analysis of retained deuterium on Be-based films: Ion implantation vs. in-situ loading

Abstract

Funding

Keywords

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