Analytical determination of parasitic resistances in GaAs MESFET´s

Silja Vatunen (Corresponding Author), Vesa Starck, Panu Siukonen

Research output: Contribution to journalArticleScientificpeer-review

Abstract

For extracting the parasitic resistances of GaAs MESFET's a method presented by P. Debie, L. Martens and D. De Zutter has been used. The method is based on three simple DC measurements and the resistance values are received through numerical iterations. It is illustrated in this paper that the parasitic resistances of MESFET's can be calculated analytically using the given method.
Therefore, numerical iterations are avoided and the extraction becomes faster. The resistance measurements show that the method is sensitive to the accuracy of the measured voltages. The repeatability can be increased by data processing the measured data.
Original languageEnglish
Pages (from-to)67-69
JournalPhysica Scripta
Volume2002
Issue numberT101
DOIs
Publication statusPublished - 2002
MoE publication typeA1 Journal article-refereed

Fingerprint Dive into the research topics of 'Analytical determination of parasitic resistances in GaAs MESFET´s'. Together they form a unique fingerprint.

  • Cite this