Applicability of FTIR/PAS depth profiling for the study of coated papers

J. Halttunen, Jussi Tenhunen, T. Saarinen, Per Stenius

Research output: Contribution to conferenceConference PosterScientific

Original languageEnglish
Number of pages1
Publication statusPublished - 1998
MoE publication typeNot Eligible
Event3rd International Symposium on Advanced Infrared and Raman Spectroscopy, AIRS III - Vienna, Austria
Duration: 5 Jul 19989 Jul 1998

Conference

Conference3rd International Symposium on Advanced Infrared and Raman Spectroscopy, AIRS III
CountryAustria
CityVienna
Period5/07/989/07/98

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