Applicability of FTIR/PAS depth profiling for the study of coated papers

J. Halttunen, Jussi Tenhunen, T. Saarinen, Per Stenius

Research output: Contribution to conference › Conference Poster › Scientific

Original language	English
Number of pages	1
Publication status	Published - 1998
MoE publication type	Not Eligible
Event	3rd International Symposium on Advanced Infrared and Raman Spectroscopy, AIRS III - Vienna, Austria Duration: 5 Jul 1998 → 9 Jul 1998

Conference	3rd International Symposium on Advanced Infrared and Raman Spectroscopy, AIRS III
Country/Territory	Austria
City	Vienna
Period	5/07/98 → 9/07/98

Cite this

@conference{26e365b0f9db4045b8db3d8ca97a644a,

title = "Applicability of FTIR/PAS depth profiling for the study of coated papers",

author = "J. Halttunen and Jussi Tenhunen and T. Saarinen and Per Stenius",

year = "1998",

language = "English",

note = "3rd International Symposium on Advanced Infrared and Raman Spectroscopy, AIRS III ; Conference date: 05-07-1998 Through 09-07-1998",

}