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Application of active piezoresistive cantilevers in high-eigenmode surface imaging

  • Bartosz Pruchnik*
  • , Dominik Badura
  • , Władysław Kopczyński
  • , Dariusz Czułek
  • , Ivo W. Rangelow
  • , Virpi Korpelainen
  • , Andrzej Sierakowski
  • , Andrew Yacoot
  • , Teodor Gotszalk
  • *Corresponding author for this work
  • Wrocław University of Science and Technology
  • Central Office of Measures (GUM)
  • nano analytik GmbH
  • Lukasiewicz Institute of Microelectronics and Photonics (Łukasiewicz-IMIF)
  • National Physics Laboratory (NPL)

Research output: Contribution to journalArticleScientificpeer-review

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