Application of active piezoresistive cantilevers in high-eigenmode surface imaging
- Bartosz Pruchnik*
- , Dominik Badura
- , Władysław Kopczyński
- , Dariusz Czułek
- , Ivo W. Rangelow
- , Virpi Korpelainen
- , Andrzej Sierakowski
- , Andrew Yacoot
- , Teodor Gotszalk
*Corresponding author for this work
- Wrocław University of Science and Technology
- Central Office of Measures (GUM)
- nano analytik GmbH
- Lukasiewicz Institute of Microelectronics and Photonics (Łukasiewicz-IMIF)
- National Physics Laboratory (NPL)
Research output: Contribution to journal › Article › Scientific › peer-review
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