Application of in situ UV-VIS spectroscopy and an in situ dc resistance measurement technique to the study of a poly(thiophene-3-methanol) film

Eeva Lankinen, Maija Pohjankallio, Göran Sundholm (Corresponding Author), Panu Talonen, Timo Laitinen, Timo Saario

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    Chemistry

    Chemical Engineering

    Material Science