Skip to main navigation Skip to search Skip to main content

Application of Scanning Electron Microscopy for Correlating Fracture Topography and Microstructure

  • Pertti Nenonen
  • , Kari Törrönen
  • , Markku Kemppainen
  • , Heikki Kotilainen

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

A new method for correlating fracture topography and microstructure has been developed. The details of the method, which utilizes scanning electron microscopy, are described. The method is applied in a microstructural analysis of cleavage crack propagation in a bainitic pressure-vessel steel.
Original languageEnglish
Title of host publicationFractography and Materials Science
EditorsL.N. Gilbertson, R.D. Zipp
Place of PublicationPhiladelphia
PublisherAmerican Society for Testing and Materials (ASTM)
Pages387-393
ISBN (Electronic)978-0-8031-4799-7
ISBN (Print)978-0-8031-0733-5
DOIs
Publication statusPublished - 1981
MoE publication typeA4 Article in a conference publication
EventFractography and Materials Science: ASTM Committee E-24 Symposium on Fracture Testing - Williamsburg, United States
Duration: 27 Nov 1979 → 28 Nov 1979

Publication series

SeriesASTM Special Technical Publication
Volume733
ISSN0066-0558

Conference

ConferenceFractography and Materials Science
Country/TerritoryUnited States
CityWilliamsburg
Period27/11/79 → 28/11/79

Fingerprint

Dive into the research topics of 'Application of Scanning Electron Microscopy for Correlating Fracture Topography and Microstructure'. Together they form a unique fingerprint.

Cite this