Application of Scanning Electron Microscopy for Correlating Fracture Topography and Microstructure

Pertti Nenonen, Kari Törrönen, Markku Kemppainen, Heikki Kotilainen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

A new method for correlating fracture topography and microstructure has been developed. The details of the method, which utilizes scanning electron microscopy, are described. The method is applied in a microstructural analysis of cleavage crack propagation in a bainitic pressure-vessel steel.
Original languageEnglish
Title of host publicationFractography and Materials Science
EditorsL.N. Gilbertson, R.D. Zipp
Place of PublicationPhiladelphia
PublisherAmerican Society for Testing and Materials (ASTM)
Pages387-393
ISBN (Electronic)978-0-8031-4799-7
ISBN (Print)978-0-8031-0733-5
DOIs
Publication statusPublished - 1981
MoE publication typeA4 Article in a conference publication
EventFractography and Materials Science: ASTM Committee E-24 Symposium on Fracture Testing - Williamsburg, United States
Duration: 27 Nov 197928 Nov 1979

Publication series

SeriesASTM Special Technical Publication
Volume733
ISSN0066-0558

Conference

ConferenceFractography and Materials Science
Country/TerritoryUnited States
CityWilliamsburg
Period27/11/7928/11/79

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