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Applications des MEMS à la métrologie électrique
Translated title of the contribution
:
Microelectromechanical components in electrical metrology
Antti Manninen
,
Anu Kärkkäinen
, Nadine Pesonen
, A. Oja
, Heikki Seppä
Research output
:
Chapter in Book/Report/Conference proceeding
›
Chapter or book article
›
Scientific
Overview
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Keyphrases
Micro-electro-mechanical Systems
100%
Electrical Metrology
100%
Micromechanics
100%
Dielectric Layer
50%
Metrology
50%
Cost Reduction
50%
System Components
50%
Electric
50%
Mass Production
50%
Good Stability
50%
Low Power Consumption
50%
Consumption Costs
50%
Electrostatic Field Effect
50%
INIS
stability
100%
microelectromechanical systems
100%
metrology
100%
layers
50%
surfaces
50%
production
50%
interfaces
50%
cost
50%
noise
50%
precision
50%
dielectrics
50%
electrostatics
50%
Engineering
Microelectromechanical System
100%
Dielectric Layer
50%
System Component
50%
Electric Field
50%
Mass Production
50%