Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

Jeremias Seppä, Bernhard Reischl, Hannu Sairanen, Virpi Korpelainen, Hannu Husu, Martti Heinonen, Paolo Raiteri, Andrew L. Rohl, Kai Nordlund, Antti Lassila

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Abstract

Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected - both in experiments and simulations - factor in the interaction force between AFM probe and sample in air. This paper describes the humidity control system designed and built for the interferometrically traceable metrology AFM (IT-MAFM) at VTT MIKES. The humidity control is based on circulating the air of the AFM enclosure via dryer and humidifier paths with adjustable flow and mixing ratio of dry and humid air. The design humidity range of the system is 20-60 %rh. Force-distance adhesion studies at humidity levels between 25 %rh and 53 %rh are presented and compared to an atomistic molecular dynamics (MD) simulation. The uncertainty level of the thermal noise method implementation used for force constant calibration of the AFM cantilevers is 10 %, being the dominant component of the interaction force measurement uncertainty. Comparing the simulation and the experiment, the primary uncertainties are related to the nominally 7 nm radius and shape of measurement probe apex, possible wear and contamination, and the atomistic simulation technique details. The interaction forces are of the same order of magnitude in simulation and measurement (5 nN). An elongation of a few nanometres of the water meniscus between probe tip and sample, before its rupture, is seen in simulation upon retraction of the tip in higher humidity. This behaviour is also supported by the presented experimental measurement data but the data is insufficient to conclusively verify the quantitative meniscus elongation.
Original languageEnglish
Article number034004
Number of pages10
JournalMeasurement Science and Technology
Volume28
Issue number3
DOIs
Publication statusPublished - 2017
MoE publication typeA1 Journal article-refereed

Fingerprint

Atomic Force Microscope
Humidity
Adhesion
Molecular Dynamics Simulation
Molecular dynamics
humidity
Atmospheric humidity
Microscopes
adhesion
microscopes
molecular dynamics
Humidity control
Computer simulation
Probe
simulation
Elongation
Air
Simulation
Interaction
Thermal noise

Keywords

  • adhesion
  • atomic force microscopy
  • capillary effects
  • force measurement
  • humidity
  • metrology

Cite this

@article{ed4074a8920a4eeb95ed14be90024c34,
title = "Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities",
abstract = "Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected - both in experiments and simulations - factor in the interaction force between AFM probe and sample in air. This paper describes the humidity control system designed and built for the interferometrically traceable metrology AFM (IT-MAFM) at VTT MIKES. The humidity control is based on circulating the air of the AFM enclosure via dryer and humidifier paths with adjustable flow and mixing ratio of dry and humid air. The design humidity range of the system is 20-60 {\%}rh. Force-distance adhesion studies at humidity levels between 25 {\%}rh and 53 {\%}rh are presented and compared to an atomistic molecular dynamics (MD) simulation. The uncertainty level of the thermal noise method implementation used for force constant calibration of the AFM cantilevers is 10 {\%}, being the dominant component of the interaction force measurement uncertainty. Comparing the simulation and the experiment, the primary uncertainties are related to the nominally 7 nm radius and shape of measurement probe apex, possible wear and contamination, and the atomistic simulation technique details. The interaction forces are of the same order of magnitude in simulation and measurement (5 nN). An elongation of a few nanometres of the water meniscus between probe tip and sample, before its rupture, is seen in simulation upon retraction of the tip in higher humidity. This behaviour is also supported by the presented experimental measurement data but the data is insufficient to conclusively verify the quantitative meniscus elongation.",
keywords = "adhesion, atomic force microscopy, capillary effects, force measurement, humidity, metrology",
author = "Jeremias Sepp{\"a} and Bernhard Reischl and Hannu Sairanen and Virpi Korpelainen and Hannu Husu and Martti Heinonen and Paolo Raiteri and Rohl, {Andrew L.} and Kai Nordlund and Antti Lassila",
year = "2017",
doi = "10.1088/1361-6501/28/3/034004",
language = "English",
volume = "28",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "Institute of Physics IOP",
number = "3",

}

Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities. / Seppä, Jeremias; Reischl, Bernhard; Sairanen, Hannu; Korpelainen, Virpi; Husu, Hannu; Heinonen, Martti; Raiteri, Paolo; Rohl, Andrew L.; Nordlund, Kai; Lassila, Antti.

In: Measurement Science and Technology, Vol. 28, No. 3, 034004, 2017.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

AU - Seppä, Jeremias

AU - Reischl, Bernhard

AU - Sairanen, Hannu

AU - Korpelainen, Virpi

AU - Husu, Hannu

AU - Heinonen, Martti

AU - Raiteri, Paolo

AU - Rohl, Andrew L.

AU - Nordlund, Kai

AU - Lassila, Antti

PY - 2017

Y1 - 2017

N2 - Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected - both in experiments and simulations - factor in the interaction force between AFM probe and sample in air. This paper describes the humidity control system designed and built for the interferometrically traceable metrology AFM (IT-MAFM) at VTT MIKES. The humidity control is based on circulating the air of the AFM enclosure via dryer and humidifier paths with adjustable flow and mixing ratio of dry and humid air. The design humidity range of the system is 20-60 %rh. Force-distance adhesion studies at humidity levels between 25 %rh and 53 %rh are presented and compared to an atomistic molecular dynamics (MD) simulation. The uncertainty level of the thermal noise method implementation used for force constant calibration of the AFM cantilevers is 10 %, being the dominant component of the interaction force measurement uncertainty. Comparing the simulation and the experiment, the primary uncertainties are related to the nominally 7 nm radius and shape of measurement probe apex, possible wear and contamination, and the atomistic simulation technique details. The interaction forces are of the same order of magnitude in simulation and measurement (5 nN). An elongation of a few nanometres of the water meniscus between probe tip and sample, before its rupture, is seen in simulation upon retraction of the tip in higher humidity. This behaviour is also supported by the presented experimental measurement data but the data is insufficient to conclusively verify the quantitative meniscus elongation.

AB - Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected - both in experiments and simulations - factor in the interaction force between AFM probe and sample in air. This paper describes the humidity control system designed and built for the interferometrically traceable metrology AFM (IT-MAFM) at VTT MIKES. The humidity control is based on circulating the air of the AFM enclosure via dryer and humidifier paths with adjustable flow and mixing ratio of dry and humid air. The design humidity range of the system is 20-60 %rh. Force-distance adhesion studies at humidity levels between 25 %rh and 53 %rh are presented and compared to an atomistic molecular dynamics (MD) simulation. The uncertainty level of the thermal noise method implementation used for force constant calibration of the AFM cantilevers is 10 %, being the dominant component of the interaction force measurement uncertainty. Comparing the simulation and the experiment, the primary uncertainties are related to the nominally 7 nm radius and shape of measurement probe apex, possible wear and contamination, and the atomistic simulation technique details. The interaction forces are of the same order of magnitude in simulation and measurement (5 nN). An elongation of a few nanometres of the water meniscus between probe tip and sample, before its rupture, is seen in simulation upon retraction of the tip in higher humidity. This behaviour is also supported by the presented experimental measurement data but the data is insufficient to conclusively verify the quantitative meniscus elongation.

KW - adhesion

KW - atomic force microscopy

KW - capillary effects

KW - force measurement

KW - humidity

KW - metrology

UR - http://www.scopus.com/inward/record.url?scp=85012049403&partnerID=8YFLogxK

U2 - 10.1088/1361-6501/28/3/034004

DO - 10.1088/1361-6501/28/3/034004

M3 - Article

VL - 28

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 3

M1 - 034004

ER -