Abstract
We demonstrate good optical quality TiO2 thin films grown by atomic layer deposition at 120°C. The optical properties were studied using spectroscopic ellipsometry and prism coupling methods. The refractive index was 2.27, and the slab waveguide propagation loss was less than 1dB/cm at 1.53μm. A high quality resonant waveguide grating was fabricated using a thin TiO2 layer on top of a SiO2 grating.
Original language | English |
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Pages (from-to) | 4321-4325 |
Number of pages | 5 |
Journal | Applied Optics |
Volume | 49 |
Issue number | 22 |
DOIs | |
Publication status | Published - 2010 |
MoE publication type | A1 Journal article-refereed |