Automatic generation of repair suggestions for overall I&C architecture represented with an ontology

Polina Ovsiannikova; Antti Pakonen; Valeriy Vyatkin

doi:10.1109/ETFA54631.2023.10275557

Automatic generation of repair suggestions for overall I&C architecture represented with an ontology

Polina Ovsiannikova, Antti Pakonen, Valeriy Vyatkin

Aalto University

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

1 Citation (Scopus)

32 Downloads (Pure)

Abstract

We present an approach for suggesting possible fixes to an overall I&C nuclear architecture during its design phase. Despite the I&C architecture, in our case, being represented with an ontology, we do not aim to change the properties of an ontology per se. Instead, we focus on the subset of ABox triples that do not contain terminological elements in either subject, predicate, or object parts. Such a subset we call the design artifacts. When the ontology is filled with the design artifacts, the analyst runs the check of non-functional requirements using SPARQL queries. The requirements associated with the queries that returned results do not hold. The goal of the current work is to provide support for the next stage when the analyst has to change the design artifacts so that the queries no longer return results. Our method is based on representing the results of queries as graphs, intersecting them, and finding the minimal changes that prevent the results from being mapped on their (or other) queries.

Original language	English
Title of host publication	2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	1-8
Number of pages	8
ISBN (Electronic)	979-8-3503-3991-8, 979-8-3503-3990-1
ISBN (Print)	979-8-3503-3992-5
DOIs	https://doi.org/10.1109/ETFA54631.2023.10275557
Publication status	Published - 15 Sept 2023
MoE publication type	A4 Article in a conference publication
Event	2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) - Sinaia, Romania Duration: 12 Sept 2023 → 15 Sept 2023

Conference

Conference	2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)
Period	12/09/23 → 15/09/23

Keywords

Ontologies
Maintenance engineering
Manufacturing automation

Access to Document

10.1109/ETFA54631.2023.10275557

Ovsiannikova ETFA 2023Accepted author manuscript, 384 KB

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Ovsiannikova, P., Pakonen, A., & Vyatkin, V. (2023). Automatic generation of repair suggestions for overall I&C architecture represented with an ontology. In 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (pp. 1-8). Article 10275557 IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ETFA54631.2023.10275557

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abstract = "We present an approach for suggesting possible fixes to an overall I&C nuclear architecture during its design phase. Despite the I&C architecture, in our case, being represented with an ontology, we do not aim to change the properties of an ontology per se. Instead, we focus on the subset of ABox triples that do not contain terminological elements in either subject, predicate, or object parts. Such a subset we call the design artifacts. When the ontology is filled with the design artifacts, the analyst runs the check of non-functional requirements using SPARQL queries. The requirements associated with the queries that returned results do not hold. The goal of the current work is to provide support for the next stage when the analyst has to change the design artifacts so that the queries no longer return results. Our method is based on representing the results of queries as graphs, intersecting them, and finding the minimal changes that prevent the results from being mapped on their (or other) queries.",

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Ovsiannikova, P, Pakonen, A & Vyatkin, V 2023, Automatic generation of repair suggestions for overall I&C architecture represented with an ontology. in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)., 10275557, IEEE Institute of Electrical and Electronic Engineers, pp. 1-8, 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA), 12/09/23. https://doi.org/10.1109/ETFA54631.2023.10275557

Automatic generation of repair suggestions for overall I&C architecture represented with an ontology. / Ovsiannikova, Polina; Pakonen, Antti; Vyatkin, Valeriy.
2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Institute of Electrical and Electronic Engineers, 2023. p. 1-8 10275557.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

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Automatic generation of repair suggestions for overall I&C architecture represented with an ontology

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Keywords

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