Automatic quality inspection of micro components using machine vision and high DOF microhandling systems

Research output: Contribution to conference › Conference article › Scientific › peer-review

Original language	English
Publication status	Published - 2006
MoE publication type	Not Eligible
Event	5th International Workshop on Microfactories, IWMF2006 - Besancon, France Duration: 25 Oct 2006 → 27 Oct 2006

Workshop	5th International Workshop on Microfactories, IWMF2006
Country/Territory	France
City	Besancon
Period	25/10/06 → 27/10/06

Cite this

@conference{95a2598dedb04e40a2bd539d72049a27,

title = "Automatic quality inspection of micro components using machine vision and high DOF microhandling systems",

author = "Veikko Sariola and Petteri Korhonen and Quan Zhou and Jukka Laitinen and Sami Sj{\"o}vall",

year = "2006",

language = "English",

note = "5th International Workshop on Microfactories, IWMF2006 ; Conference date: 25-10-2006 Through 27-10-2006",

}

TY - CONF

T1 - Automatic quality inspection of micro components using machine vision and high DOF microhandling systems

AU - Sariola, Veikko

AU - Korhonen, Petteri

AU - Zhou, Quan

AU - Laitinen, Jukka

AU - Sjövall, Sami

PY - 2006

Y1 - 2006

M3 - Conference article

T2 - 5th International Workshop on Microfactories, IWMF2006

Y2 - 25 October 2006 through 27 October 2006

ER -