Automation in sensor network metrology: An overview of methods and their implementations

Anupam Prasad Vedurmudi^*
, Kruno Miličević
, Gertjan Kok
, Bang Xiang Yong
, Liming Xu
, Ge Zheng
, Alexandra Brintrup
, Maximilian Gruber
, Shahin Tabandeh
, Martha Arbayani Zaidan
, André Xhonneux
, Jonathan Pearce

^*Corresponding author for this work

SU1203 Process metrology

German National Metrology Institute (PTB)
Random Red d.o.o.
Dutch Metrology Institute (VSL)
University of Cambridge
University of Helsinki
Forschungszentrum Jülich GmbH (FZJ)
National Physics Laboratory (NPL)

Research output: Contribution to journal › Article in a proceedings journal › Scientific › peer-review

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