Avoidance of contamination in trace element analysis by RIS

Riitta Zilliacus, Eeva-Liisa Lakomaa, Iiro Auterinen, Jari Likonen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationResonance Ionization Spectroscopy 1986
    Subtitle of host publicationProceedings of the 3rd International Symposium on Resonance Ionization and Its Applications
    EditorsGeorge Samuel Hurst, Colyn Grey Morgan
    Place of PublicationBristol
    PublisherInstitute of Physics IOP
    Pages341-342
    ISBN (Print)978-0-85498-175-5
    Publication statusPublished - 1987
    MoE publication typeA4 Article in a conference publication
    EventThird International Symposium on Resonance Ionization Spectroscopy and Its Applications - Swansea, United Kingdom
    Duration: 7 Sep 198612 Sep 1986

    Publication series

    SeriesInstitute of Physics Conference Series
    Volume84
    ISSN0951-3248

    Conference

    ConferenceThird International Symposium on Resonance Ionization Spectroscopy and Its Applications
    CountryUnited Kingdom
    CitySwansea
    Period7/09/8612/09/86

    Cite this

    Zilliacus, R., Lakomaa, E-L., Auterinen, I., & Likonen, J. (1987). Avoidance of contamination in trace element analysis by RIS. In G. S. Hurst, & C. G. Morgan (Eds.), Resonance Ionization Spectroscopy 1986: Proceedings of the 3rd International Symposium on Resonance Ionization and Its Applications (pp. 341-342). Institute of Physics IOP. Institute of Physics Conference Series, Vol.. 84