Background-filtered transmission diffraction with internal intensity calibration

Pekka Hiismäki

Research output: Contribution to journalArticleScientificpeer-review

Abstract

It is inferred that by frequency filtering the logarithm of the time-of-flight spectrum of neutrons that have passed through a powdered isotropic crystalline
sample a diffractogram may be obtained with many desirable properties for achieving high-quality refinement of structural parameters.
Apart from multiple scattering no wavelength-dependent effects or corrections need to be introduced, which implies
automatic internal calibration of the Bragg intensities.
For utilization of the inherent high resolution of the transmission geometry, a Fourier chopper in the
pulsed beam from an intensity-optimized quasisteady-state moderator is suggested. Results of model calculations are presented.
Original languageEnglish
Pages (from-to)79-83
JournalJournal of Applied Crystallography
Volume22
Issue number2
DOIs
Publication statusPublished - 1989
MoE publication typeA1 Journal article-refereed

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Moderators
Multiple scattering
Neutrons
Calibration
Diffraction
Wavelength
Geometry

Cite this

@article{e3445c670cc9451081f49fed6eb46449,
title = "Background-filtered transmission diffraction with internal intensity calibration",
abstract = "It is inferred that by frequency filtering the logarithm of the time-of-flight spectrum of neutrons that have passed through a powdered isotropic crystallinesample a diffractogram may be obtained with many desirable properties for achieving high-quality refinement of structural parameters. Apart from multiple scattering no wavelength-dependent effects or corrections need to be introduced, which impliesautomatic internal calibration of the Bragg intensities.For utilization of the inherent high resolution of the transmission geometry, a Fourier chopper in thepulsed beam from an intensity-optimized quasisteady-state moderator is suggested. Results of model calculations are presented.",
author = "Pekka Hiism{\"a}ki",
year = "1989",
doi = "10.1107/S0021889888010015",
language = "English",
volume = "22",
pages = "79--83",
journal = "Journal of Applied Crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",
number = "2",

}

Background-filtered transmission diffraction with internal intensity calibration. / Hiismäki, Pekka.

In: Journal of Applied Crystallography, Vol. 22, No. 2, 1989, p. 79-83.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Background-filtered transmission diffraction with internal intensity calibration

AU - Hiismäki, Pekka

PY - 1989

Y1 - 1989

N2 - It is inferred that by frequency filtering the logarithm of the time-of-flight spectrum of neutrons that have passed through a powdered isotropic crystallinesample a diffractogram may be obtained with many desirable properties for achieving high-quality refinement of structural parameters. Apart from multiple scattering no wavelength-dependent effects or corrections need to be introduced, which impliesautomatic internal calibration of the Bragg intensities.For utilization of the inherent high resolution of the transmission geometry, a Fourier chopper in thepulsed beam from an intensity-optimized quasisteady-state moderator is suggested. Results of model calculations are presented.

AB - It is inferred that by frequency filtering the logarithm of the time-of-flight spectrum of neutrons that have passed through a powdered isotropic crystallinesample a diffractogram may be obtained with many desirable properties for achieving high-quality refinement of structural parameters. Apart from multiple scattering no wavelength-dependent effects or corrections need to be introduced, which impliesautomatic internal calibration of the Bragg intensities.For utilization of the inherent high resolution of the transmission geometry, a Fourier chopper in thepulsed beam from an intensity-optimized quasisteady-state moderator is suggested. Results of model calculations are presented.

U2 - 10.1107/S0021889888010015

DO - 10.1107/S0021889888010015

M3 - Article

VL - 22

SP - 79

EP - 83

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

IS - 2

ER -