Backscattering analysis of reactively co-sputtered in situ annealed superconducting Y1Ba2Cu3O7-x thin films

Jaakko Saarilahti, Jorma Salmi, Eero Rauhala

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationIon beam analysis
    Subtitle of host publicationproceedings of the Tenth International Conference on Ion Beam Analysis
    EditorsH.H. Brongersma, M.J.A. de Voigt
    Place of PublicationEindhoven
    PublisherElsevier
    Number of pages46
    Publication statusPublished - 1991
    MoE publication typeA4 Article in a conference publication
    Event10th International Conference on Ion Beam Analysis - Eindhoven, Netherlands
    Duration: 1 Jul 19915 Jul 1991

    Publication series

    SeriesNuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
    VolumeB64
    ISSN0168-583X

    Conference

    Conference10th International Conference on Ion Beam Analysis
    CountryNetherlands
    CityEindhoven
    Period1/07/915/07/91

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