Abstract
Thin (30-40 nm) and highly uniform Al2O3 coatings have
been deposited at relatively low temperature of 100 °C
onto various polymeric materials employing the atomic
layer deposition (ALD) technique, both batch and
roll-to-roll (R2R) mode. The applications for ALD have
long been limited those feasible for batch processing.
The work demonstrates that R2R ALD can deposit thin films
with properties that are comparable to the film
properties fabricated by in batch. This accelerates
considerably the commercialization of many products, such
as flexible, printed electronics, organic light-emitting
diode lighting, third generation thin film photovoltaic
devices, high energy density thin film batteries, smart
textiles, organic sensors, organic/recyclable packaging
materials, and flexible displays, to name a few.
Original language | English |
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Pages (from-to) | 164 - 169 |
Journal | Thin Solid Films |
Volume | 550 |
DOIs | |
Publication status | Published - 2014 |
MoE publication type | A1 Journal article-refereed |
Keywords
- atomic layer deposition
- barrier
- roll-to-roll
- flexible material
- aluminum oxide
- polymer