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Bayesian approach for validation of runaway electron simulations

  • Aaro Järvinen
  • , Tünde Fülöp
  • , Eero Hirvijoki
  • , Mathias Hoppe
  • , Adam Kit
  • , Jan Åström
    • Chalmers University of Technology
    • Aalto University
    • Ecole Polytechnique Fédérale de Lausanne (EPFL)
    • University of Helsinki
    • CSC - IT Center for Science

    Research output: Contribution to conferenceConference AbstractScientific

    Original languageEnglish
    Number of pages1
    Publication statusPublished - 2022
    MoE publication typeNot Eligible
    Event9th Runaway Electron Modelling (REM) meeting - IPP Garching, Garching, Germany
    Duration: 2 May 20226 May 2022
    https://ft.nephy.chalmers.se/?p=conference&id=3

    Conference

    Conference9th Runaway Electron Modelling (REM) meeting
    Country/TerritoryGermany
    CityGarching
    Period2/05/226/05/22
    Internet address

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