Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm wafer

I. Hietanen, J. Lindgren, R. Orava, T. Tuuva, R. Brenner, Mikael Andersson, Kari Leinonen, Hannu Ronkainen, M. Turala, P. Weilhammer, W. Dulinski, D. Husson, A. Lounis, M. Schaeffer, R. Turchetta, J. Chauveau

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    Abstract

    A capacitively coupled silicon strip detector with 50 μm readout pitch has been tested in a pion beam at CERN. The spatial resolution of the detector equipped with LSI readout chips was 4.9 μm and the most probable signal-to-single-channel noise ratio was 31.
    Original languageEnglish
    Pages (from-to)677-680
    JournalNuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    Volume310
    Issue number3
    DOIs
    Publication statusPublished - 1991
    MoE publication typeA1 Journal article-refereed

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  • Cite this

    Hietanen, I., Lindgren, J., Orava, R., Tuuva, T., Brenner, R., Andersson, M., Leinonen, K., Ronkainen, H., Turala, M., Weilhammer, P., Dulinski, W., Husson, D., Lounis, A., Schaeffer, M., Turchetta, R., & Chauveau, J. (1991). Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm wafer. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 310(3), 677-680. https://doi.org/10.1016/0168-9002(91)91116-D