Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm wafer

  • I. Hietanen
  • , J. Lindgren
  • , R. Orava
  • , T. Tuuva
  • , R. Brenner
  • , Mikael Andersson
  • , Kari Leinonen
  • , Hannu Ronkainen
  • , M. Turala
  • , P. Weilhammer
  • , W. Dulinski
  • , D. Husson
  • , A. Lounis
  • , M. Schaeffer
  • , R. Turchetta
  • , J. Chauveau

    Research output: Contribution to journalArticleScientificpeer-review

    Abstract

    A capacitively coupled silicon strip detector with 50 μm readout pitch has been tested in a pion beam at CERN. The spatial resolution of the detector equipped with LSI readout chips was 4.9 μm and the most probable signal-to-single-channel noise ratio was 31.
    Original languageEnglish
    Pages (from-to)677-680
    JournalNuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    Volume310
    Issue number3
    DOIs
    Publication statusPublished - 1991
    MoE publication typeA1 Journal article-refereed

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