Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm wafer

I. Hietanen, J. Lindgren, R. Orava, T. Tuuva, R. Brenner, Mikael Andersson, Kari Leinonen, Hannu Ronkainen, M. Turala, P. Weilhammer, W. Dulinski, D. Husson, A. Lounis, M. Schaeffer, R. Turchetta, J. Chauveau

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