Behaviour pattern-based model generation for model-based testing

Teemu Kanstrén

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Abstract

This paper presents the concept of using behavioral pattern mining to generate models for model-based testing. These patterns are mined from observations captured from execution scenarios of the system under test, and the different patterns are combined in order to provide a suitable higher level model for model-based testing. The concept is first discussed on a general level, providing a basis for implementation of semi-automated model generation algorithms based on combinations of different behavioral patterns. This concept is illustrated by showing how to generate extended finite state machine models in a format suitable for model-based testing. The generated model is further validated by applying it for model-based testing of a real software component, where it reveals actual faults in the system under test. In addition to the benefits, the discovered limitations of the approach are discussed. Future work is discussed as potential means to address these limitations. (19 refs.)
Original languageEnglish
Title of host publicationProceedings of the 2009 Computation World: Future Computing, Service Computation, Cognitive, Adaptive, Content, Patterns (ComputationWorld 2009). Athens, Greece, 15 - 20 Nov. 2009
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages233-241
ISBN (Print)978-1-4244-5166-1, 978-0-7695-3862-4
DOIs
Publication statusPublished - 2009
MoE publication typeA4 Article in a conference publication
EventComputation World: Future Computing, Service Computation, Cognitive, Adaptive, Content, Patterns, ComputationWorld 2009 - Athens, Greece
Duration: 15 Nov 200920 Nov 2009

Conference

ConferenceComputation World: Future Computing, Service Computation, Cognitive, Adaptive, Content, Patterns, ComputationWorld 2009
Abbreviated titleComputationWorld 2009
CountryGreece
CityAthens
Period15/11/0920/11/09

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  • Cite this

    Kanstrén, T. (2009). Behaviour pattern-based model generation for model-based testing. In Proceedings of the 2009 Computation World: Future Computing, Service Computation, Cognitive, Adaptive, Content, Patterns (ComputationWorld 2009). Athens, Greece, 15 - 20 Nov. 2009 (pp. 233-241). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ComputationWorld.2009.10