Beyond CMOS: Benchmarking for future technologies

C.M. Sotomayor Torres, Jouni Ahopelto, M.W.M. Graef, R.M. Popp, W. Rosenstiel

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings
    Subtitle of host publicationDesign, Automation and Test in Europe, DATE 2012
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages129-134
    ISBN (Print) 978-3-9810-8018-6, 978-1-4577-2145-8
    DOIs
    Publication statusPublished - 2012
    MoE publication typeNot Eligible
    Event15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012 -
    Duration: 1 Jan 2012 → …

    Conference

    Conference15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012
    Period1/01/12 → …

    Cite this

    Sotomayor Torres, C. M., Ahopelto, J., Graef, M. W. M., Popp, R. M., & Rosenstiel, W. (2012). Beyond CMOS: Benchmarking for future technologies. In Proceedings : Design, Automation and Test in Europe, DATE 2012 (pp. 129-134). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/DATE.2012.6176445
    Sotomayor Torres, C.M. ; Ahopelto, Jouni ; Graef, M.W.M. ; Popp, R.M. ; Rosenstiel, W. / Beyond CMOS : Benchmarking for future technologies. Proceedings : Design, Automation and Test in Europe, DATE 2012. IEEE Institute of Electrical and Electronic Engineers , 2012. pp. 129-134
    @inproceedings{951ff610a0fe49b0b6b2609f4a2df247,
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    language = "English",
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    Sotomayor Torres, CM, Ahopelto, J, Graef, MWM, Popp, RM & Rosenstiel, W 2012, Beyond CMOS: Benchmarking for future technologies. in Proceedings : Design, Automation and Test in Europe, DATE 2012. IEEE Institute of Electrical and Electronic Engineers , pp. 129-134, 15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012, 1/01/12. https://doi.org/10.1109/DATE.2012.6176445

    Beyond CMOS : Benchmarking for future technologies. / Sotomayor Torres, C.M.; Ahopelto, Jouni; Graef, M.W.M.; Popp, R.M.; Rosenstiel, W.

    Proceedings : Design, Automation and Test in Europe, DATE 2012. IEEE Institute of Electrical and Electronic Engineers , 2012. p. 129-134.

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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    Sotomayor Torres CM, Ahopelto J, Graef MWM, Popp RM, Rosenstiel W. Beyond CMOS: Benchmarking for future technologies. In Proceedings : Design, Automation and Test in Europe, DATE 2012. IEEE Institute of Electrical and Electronic Engineers . 2012. p. 129-134 https://doi.org/10.1109/DATE.2012.6176445