Beyond CMOS: Benchmarking for future technologies

C.M. Sotomayor Torres, Jouni Ahopelto, M.W.M. Graef, R.M. Popp, W. Rosenstiel

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publicationProceedings
    Subtitle of host publicationDesign, Automation and Test in Europe, DATE 2012
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages129-134
    ISBN (Print) 978-3-9810-8018-6, 978-1-4577-2145-8
    DOIs
    Publication statusPublished - 2012
    MoE publication typeNot Eligible
    Event15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012 -
    Duration: 1 Jan 2012 → …

    Conference

    Conference15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012
    Period1/01/12 → …

    Cite this

    Sotomayor Torres, C. M., Ahopelto, J., Graef, M. W. M., Popp, R. M., & Rosenstiel, W. (2012). Beyond CMOS: Benchmarking for future technologies. In Proceedings : Design, Automation and Test in Europe, DATE 2012 (pp. 129-134). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/DATE.2012.6176445