Beyond CMOS: Benchmarking for future technologies

C.M. Sotomayor Torres; Jouni Ahopelto; M.W.M. Graef; R.M. Popp; W. Rosenstiel

doi:10.1109/DATE.2012.6176445

Beyond CMOS: Benchmarking for future technologies

C.M. Sotomayor Torres
, Jouni Ahopelto
, M.W.M. Graef
, R.M. Popp
, W. Rosenstiel

Catalan Institute of Nanoscience and Nanotechnology (ICN2)
Delft University of Technology
edacentrum GmbH
University of Tübingen

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	Proceedings
Subtitle of host publication	Design, Automation and Test in Europe, DATE 2012
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	129-134
ISBN (Print)	978-3-9810-8018-6, 978-1-4577-2145-8
DOIs	https://doi.org/10.1109/DATE.2012.6176445
Publication status	Published - 2012
MoE publication type	Not Eligible
Event	15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012 - Duration: 1 Jan 2012 → …

Conference

Conference	15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012
Period	1/01/12 → …

Access to Document

10.1109/DATE.2012.6176445

Cite this

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title = "Beyond CMOS: Benchmarking for future technologies",

author = "\{Sotomayor Torres\}, C.M. and Jouni Ahopelto and M.W.M. Graef and R.M. Popp and W. Rosenstiel",

year = "2012",

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language = "English",

isbn = " 978-3-9810-8018-6",

pages = "129--134",

booktitle = "Proceedings",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

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note = "15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012 ; Conference date: 01-01-2012",

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Sotomayor Torres, CM, Ahopelto, J, Graef, MWM, Popp, RM & Rosenstiel, W 2012, Beyond CMOS: Benchmarking for future technologies. in Proceedings : Design, Automation and Test in Europe, DATE 2012. IEEE Institute of Electrical and Electronic Engineers, pp. 129-134, 15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012. Dresden, Germany, 12-16 March 2012, 1/01/12. https://doi.org/10.1109/DATE.2012.6176445

Beyond CMOS: Benchmarking for future technologies. / Sotomayor Torres, C.M.; Ahopelto, Jouni; Graef, M.W.M. et al.
Proceedings : Design, Automation and Test in Europe, DATE 2012. IEEE Institute of Electrical and Electronic Engineers, 2012. p. 129-134.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

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AU - Sotomayor Torres, C.M.

AU - Ahopelto, Jouni

AU - Graef, M.W.M.

AU - Popp, R.M.

AU - Rosenstiel, W.

PY - 2012

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DO - 10.1109/DATE.2012.6176445

M3 - Conference article in proceedings

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SN - 978-1-4577-2145-8

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BT - Proceedings

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