Bilateral high voltage ac peak and rms value comparison up to 150 kV between VTT and PTB

J. Meisner, Esa-Pekka Suomalainen, Jari Hällström, M. Schmidt, H. Seifert

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

This paper describes the measuring systems, setup and results of an rms and peak ac high voltage comparison performed at PTB in 2015. The three measuring systems are based on different principles. VTT system is a compressed gas capacitor based voltage divider together with a sampling voltmeter and signal processing. PTB's systems are based on the measuring of loading current of high voltage compressed gas capacitors. Differences in measured peak and rms voltages according to IEC 60060-1:2010 were less than 50 µV/V for all measured voltage levels. This comparison is a follow-up to resolve the differences that arose during EURAMET.EM-S33 comparison.
Original languageEnglish
Title of host publicationPrecision Electromagnetic Measurements (CPEM 2016), 2016 Conference on
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages1-2
ISBN (Electronic)978-1-4673-9134-4, 978-1-4673-9132-0
ISBN (Print)978-1-4673-9135-1
DOIs
Publication statusPublished - 11 Aug 2016
MoE publication typeA4 Article in a conference publication
EventConference on Precision Electromagnetic Measurements, CPEM 2016 - Ottawa, Canada
Duration: 10 Jul 201615 Jul 2016

Conference

ConferenceConference on Precision Electromagnetic Measurements, CPEM 2016
Abbreviated titleCPEM 2016
CountryCanada
CityOttawa
Period10/07/1615/07/16

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Keywords

  • high voltage measurement
  • measurement
  • measurement standards
  • measurement techniques
  • measurement uncertainty
  • precision measurements
  • uncertainty

Cite this

Meisner, J., Suomalainen, E-P., Hällström, J., Schmidt, M., & Seifert, H. (2016). Bilateral high voltage ac peak and rms value comparison up to 150 kV between VTT and PTB. In Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on (pp. 1-2). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/CPEM.2016.7540801