Carbon-Nanotube Metrology

Ado Jorio, Esko I. Kauppinen, Abdou Hassanien

Research output: Chapter in Book/Report/Conference proceedingChapter or book articleScientificpeer-review

Abstract

Scientific and industrial metrology provided tools for technological growth andinnovation, by fostering competitiveness and creating a favorable environment forscientific and industrial development. Every major country has its own metrologyinstitute to support companies in increasing their productivity and the quality oftheir goods and services. The fast development of carbon-nanotube science andapplications urged studies on metrology, standardization and industrial qualitycontrol. Development of protocols for the definition of sample parameters likestructural metrics, physical properties and stability are important for both researchand applications of single-, double- and multiwall carbon nanotubes. This workdiscusses some of the experimental techniques that are broadly used forcarbon-nanotube characterization, including scanning probe microscopy andspectroscopy, electron microscopy and diffraction, and optical spectroscopies, fromthe molecular level to bulk properties, addressing achievements, limitations anddirections where further research is needed for the development of standards andprotocols for metrology, standardization and industrial quality control of carbonnanotubes.
Original languageEnglish
Title of host publicationCarbon Nanotubes
Subtitle of host publicationAdvanced Topics in the Synthesis, Structure, Properties and Applications
EditorsAdo Jorio, Gene Dresselhaus, Mildred S. Dresselhaus
Place of PublicationBerlin
PublisherSpringer
Pages63-100
ISBN (Electronic)978-3-540-72865-8
ISBN (Print)978-3-540-72864-1
DOIs
Publication statusPublished - 2008
MoE publication typeA3 Part of a book or another research book

Publication series

NameTopics in Applied Physics
PublisherSpringer
Volume111
ISSN (Print)0303-4216
ISSN (Electronic)1437-0859

Fingerprint

metrology
carbon nanotubes
standardization
molecular spectroscopy
quality control
productivity
nanotubes
electron microscopy
electron diffraction
physical properties
microscopy
scanning
probes

Cite this

Jorio, A., Kauppinen, E. I., & Hassanien, A. (2008). Carbon-Nanotube Metrology. In A. Jorio, G. Dresselhaus, & M. S. Dresselhaus (Eds.), Carbon Nanotubes: Advanced Topics in the Synthesis, Structure, Properties and Applications (pp. 63-100). Berlin: Springer. Topics in Applied Physics, Vol.. 111 https://doi.org/10.1007/978-3-540-72865-8_3
Jorio, Ado ; Kauppinen, Esko I. ; Hassanien, Abdou. / Carbon-Nanotube Metrology. Carbon Nanotubes: Advanced Topics in the Synthesis, Structure, Properties and Applications. editor / Ado Jorio ; Gene Dresselhaus ; Mildred S. Dresselhaus. Berlin : Springer, 2008. pp. 63-100 (Topics in Applied Physics, Vol. 111).
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Jorio, A, Kauppinen, EI & Hassanien, A 2008, Carbon-Nanotube Metrology. in A Jorio, G Dresselhaus & MS Dresselhaus (eds), Carbon Nanotubes: Advanced Topics in the Synthesis, Structure, Properties and Applications. Springer, Berlin, Topics in Applied Physics, vol. 111, pp. 63-100. https://doi.org/10.1007/978-3-540-72865-8_3

Carbon-Nanotube Metrology. / Jorio, Ado; Kauppinen, Esko I.; Hassanien, Abdou.

Carbon Nanotubes: Advanced Topics in the Synthesis, Structure, Properties and Applications. ed. / Ado Jorio; Gene Dresselhaus; Mildred S. Dresselhaus. Berlin : Springer, 2008. p. 63-100 (Topics in Applied Physics, Vol. 111).

Research output: Chapter in Book/Report/Conference proceedingChapter or book articleScientificpeer-review

TY - CHAP

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AB - Scientific and industrial metrology provided tools for technological growth andinnovation, by fostering competitiveness and creating a favorable environment forscientific and industrial development. Every major country has its own metrologyinstitute to support companies in increasing their productivity and the quality oftheir goods and services. The fast development of carbon-nanotube science andapplications urged studies on metrology, standardization and industrial qualitycontrol. Development of protocols for the definition of sample parameters likestructural metrics, physical properties and stability are important for both researchand applications of single-, double- and multiwall carbon nanotubes. This workdiscusses some of the experimental techniques that are broadly used forcarbon-nanotube characterization, including scanning probe microscopy andspectroscopy, electron microscopy and diffraction, and optical spectroscopies, fromthe molecular level to bulk properties, addressing achievements, limitations anddirections where further research is needed for the development of standards andprotocols for metrology, standardization and industrial quality control of carbonnanotubes.

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Jorio A, Kauppinen EI, Hassanien A. Carbon-Nanotube Metrology. In Jorio A, Dresselhaus G, Dresselhaus MS, editors, Carbon Nanotubes: Advanced Topics in the Synthesis, Structure, Properties and Applications. Berlin: Springer. 2008. p. 63-100. (Topics in Applied Physics, Vol. 111). https://doi.org/10.1007/978-3-540-72865-8_3