Carbon-Nanotube Metrology

Ado Jorio, Esko I. Kauppinen, Abdou Hassanien

Research output: Chapter in Book/Report/Conference proceedingChapter or book articleScientificpeer-review


Scientific and industrial metrology provided tools for technological growth andinnovation, by fostering competitiveness and creating a favorable environment forscientific and industrial development. Every major country has its own metrologyinstitute to support companies in increasing their productivity and the quality oftheir goods and services. The fast development of carbon-nanotube science andapplications urged studies on metrology, standardization and industrial qualitycontrol. Development of protocols for the definition of sample parameters likestructural metrics, physical properties and stability are important for both researchand applications of single-, double- and multiwall carbon nanotubes. This workdiscusses some of the experimental techniques that are broadly used forcarbon-nanotube characterization, including scanning probe microscopy andspectroscopy, electron microscopy and diffraction, and optical spectroscopies, fromthe molecular level to bulk properties, addressing achievements, limitations anddirections where further research is needed for the development of standards andprotocols for metrology, standardization and industrial quality control of carbonnanotubes.
Original languageEnglish
Title of host publicationCarbon Nanotubes
Subtitle of host publicationAdvanced Topics in the Synthesis, Structure, Properties and Applications
EditorsAdo Jorio, Gene Dresselhaus, Mildred S. Dresselhaus
Place of PublicationBerlin
ISBN (Electronic)978-3-540-72865-8
ISBN (Print)978-3-540-72864-1
Publication statusPublished - 2008
MoE publication typeA3 Part of a book or another research book

Publication series

SeriesTopics in Applied Physics


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