Characterisation of edgeless technologies for pixellated and strip silicon detectors with a micro-focused X-ray beam

R. Bates, A. Blue, M. Christophersen, L. Eklund, S. Ely, V. Fadeyev, E. Gimenez, V. Kachkanov, Juha Kalliopuska, A. Macchiolo, D. Maneuski, B.F. Phlips, F.-W. Sadrozinski, G. Stewart, N. Tartoni, R.M. Zain

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