Characterisation of edgeless technologies for pixellated and strip silicon detectors with a micro-focused X-ray beam

  • R. Bates
  • , Andrew Blue*
  • , M. Christophersen
  • , L. Eklund
  • , S. Ely
  • , V. Fadeyev
  • , E. Gimenez
  • , V. Kachkanov
  • , Juha Kalliopuska
  • , A. Macchiolo
  • , D. Maneuski
  • , B.F. Phlips
  • , F.-W. Sadrozinski
  • , G. Stewart
  • , N. Tartoni
  • , R.M. Zain
    • *Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

14   Link opens in a new tab Citations (Scopus)

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