Characterisation of industrial TiO2 pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods

Unto Tapper, Esko Kauppinen, Juha Jalava

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of 12th European Congress on Electron Microscopy, EUREM 2000
Subtitle of host publication	Instrumentation and Methodology
Place of Publication	Brno
Pages	295 - 296
Volume	3
Publication status	Published - 2000
MoE publication type	A4 Article in a conference publication
Event	12th European Congress on Electron Microscopy, EUREM 2000 - Brno, Czech Republic Duration: 9 Jul 2000 → 14 Jul 2000

Conference	12th European Congress on Electron Microscopy, EUREM 2000
Country	Czech Republic
City	Brno
Period	9/07/00 → 14/07/00

Cite this

@inproceedings{8f17c0a6ceea4d8cbc456c6897580596,

title = "Characterisation of industrial TiO2 pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods",

author = "Unto Tapper and Esko Kauppinen and Juha Jalava",

note = "Project code: K0SU00166; 12th European Congress on Electron Microscopy, EUREM 2000 ; Conference date: 09-07-2000 Through 14-07-2000",

year = "2000",

language = "English",

isbn = "80-238-5501-8",

volume = "3",

pages = "295 -- 296",

booktitle = "Proceedings of 12th European Congress on Electron Microscopy, EUREM 2000",

}

Tapper, U, Kauppinen, E & Jalava, J 2000, Characterisation of industrial TiO2 pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods. in Proceedings of 12th European Congress on Electron Microscopy, EUREM 2000: Instrumentation and Methodology. vol. 3, Brno, pp. 295 - 296, 12th European Congress on Electron Microscopy, EUREM 2000, Brno, Czech Republic, 9/07/00.

Proceedings of 12th European Congress on Electron Microscopy, EUREM 2000: Instrumentation and Methodology. Vol. 3 Brno, 2000. p. 295 - 296.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Characterisation of industrial TiO2 pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods

AU - Tapper, Unto

AU - Kauppinen, Esko

AU - Jalava, Juha

N1 - Project code: K0SU00166

PY - 2000

Y1 - 2000

M3 - Conference article in proceedings

SN - 80-238-5501-8

VL - 3

SP - 295

EP - 296

BT - Proceedings of 12th European Congress on Electron Microscopy, EUREM 2000

CY - Brno

T2 - 12th European Congress on Electron Microscopy, EUREM 2000

Y2 - 9 July 2000 through 14 July 2000

ER -