Characterisation of industrial TiO2 pigments with low voltage FE-SEM/EDX and FE-TEM/STEM/EDX methods

Unto Tapper, Esko Kauppinen, Juha Jalava

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of 12th European Congress on Electron Microscopy, EUREM 2000
    Subtitle of host publication Instrumentation and Methodology
    Place of PublicationBrno
    Pages295 - 296
    Volume3
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication
    Event12th European Congress on Electron Microscopy, EUREM 2000 - Brno, Czech Republic
    Duration: 9 Jul 200014 Jul 2000

    Conference

    Conference12th European Congress on Electron Microscopy, EUREM 2000
    CountryCzech Republic
    CityBrno
    Period9/07/0014/07/00

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