Abstract
Schottky diode technology is used for frequency
conversion and generation in three of the mm-wave and THz
instruments on-board the European Space Agency's MetOp-SG
satellites. The instruments are MWS (MicroWave Sounder),
MWI (Microwave Imager) and ICI (Ice Cloud Imager). In
order to ensure the storage and operational life time in
addition to performance requirements, reliability
assessment for the diodes is performed well before the
fabrication of the instruments flight models. This paper
presents the thermal characterisation of Schottky diodes
used in the instruments as a part of reliability
assessment process. Different multiplier and mixer
prototype modules have been developed and thermally
tested. In addition, thermal simulations are also carried
out for comparison with the measurement results.
Furthermore, thermal measurements on several identical
multiplier blocks are also made that provides information
on reproducibility of the assembly of discrete RF devices
from the thermal perspective. Finally, some RF
measurements are also carried out for comparison to the
thermal impedance measurement results made on the same
block and the same diodes.
Original language | English |
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Title of host publication | Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015 |
Publisher | Harvard-Smithsonian Center for Astrophysics |
Number of pages | 5 |
Publication status | Published - 2015 |
MoE publication type | B3 Non-refereed article in conference proceedings |
Event | 26th International Symposium on Space Terahertz Technology - Cambridge, United States Duration: 16 Mar 2015 → 18 Mar 2015 |
Conference
Conference | 26th International Symposium on Space Terahertz Technology |
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Country/Territory | United States |
City | Cambridge |
Period | 16/03/15 → 18/03/15 |
Keywords
- Schottky diodes
- characterisation
- THz