Abstract
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015 |
| Number of pages | 5 |
| Publication status | Published - 2015 |
| MoE publication type | B3 Non-refereed article in conference proceedings |
| Event | 26th International Symposium on Space Terahertz Technology - Cambridge, United States Duration: 16 Mar 2015 → 18 Mar 2015 |
Conference
| Conference | 26th International Symposium on Space Terahertz Technology |
|---|---|
| Country | United States |
| City | Cambridge |
| Period | 16/03/15 → 18/03/15 |
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Keywords
- Schottky diodes
- characterisation
- THz
Cite this
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Characterisation of THz Schottky diodes for MetOp-SG instruments. / Khanal, Subash; Kiuru, Tero; Thomas, Bertrand; Mallat, Juha; Pinta, Christian; Nagel, Mathias; Walber, Achim; Kangas, Ville; Perichaud, Marie; Brandt, Michael; Närhi, Tapani; Räisänen, Antti.
Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015. 2015. T1-4.Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific
TY - GEN
T1 - Characterisation of THz Schottky diodes for MetOp-SG instruments
AU - Khanal, Subash
AU - Kiuru, Tero
AU - Thomas, Bertrand
AU - Mallat, Juha
AU - Pinta, Christian
AU - Nagel, Mathias
AU - Walber, Achim
AU - Kangas, Ville
AU - Perichaud, Marie
AU - Brandt, Michael
AU - Närhi, Tapani
AU - Räisänen, Antti
PY - 2015
Y1 - 2015
N2 - Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.
AB - Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.
KW - Schottky diodes
KW - characterisation
KW - THz
M3 - Conference article in proceedings
BT - Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015
ER -