Characterisation of THz Schottky diodes for MetOp-SG instruments

Subash Khanal; Tero Kiuru; Bertrand Thomas; Juha Mallat; Christian Pinta; Mathias Nagel; Achim Walber; Ville Kangas; Marie Perichaud; Michael Brandt; Tapani Närhi; Antti Räisänen

Characterisation of THz Schottky diodes for MetOp-SG instruments

Subash Khanal, Tero Kiuru, Bertrand Thomas, Juha Mallat, Christian Pinta, Mathias Nagel, Achim Walber, Ville Kangas, Marie Perichaud, Michael Brandt, Tapani Närhi, Antti Räisänen

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

1 Citation (Scopus)

Abstract

Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.

Original language	English
Title of host publication	Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015
Number of pages	5
Publication status	Published - 2015
MoE publication type	B3 Non-refereed article in conference proceedings
Event	26th International Symposium on Space Terahertz Technology - Cambridge, United States Duration: 16 Mar 2015 → 18 Mar 2015

Conference

Conference	26th International Symposium on Space Terahertz Technology
Country	United States
City	Cambridge
Period	16/03/15 → 18/03/15

Keywords

Schottky diodes
characterisation
THz

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https://www.cfa.harvard.edu/events/2015/isstt2015/proceedings/files/ISSTT2015_T1-4_Khanal_Abstract.pdf

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Khanal, S., Kiuru, T., Thomas, B., Mallat, J., Pinta, C., Nagel, M., Walber, A., Kangas, V., Perichaud, M., Brandt, M., Närhi, T., & Räisänen, A. (2015). Characterisation of THz Schottky diodes for MetOp-SG instruments. In Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015 [T1-4] https://www.cfa.harvard.edu/events/2015/isstt2015/proceedings/files/ISSTT2015_T1-4_Khanal_Abstract.pdf

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title = "Characterisation of THz Schottky diodes for MetOp-SG instruments",

abstract = "Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.",

keywords = "Schottky diodes, characterisation, THz",

author = "Subash Khanal and Tero Kiuru and Bertrand Thomas and Juha Mallat and Christian Pinta and Mathias Nagel and Achim Walber and Ville Kangas and Marie Perichaud and Michael Brandt and Tapani N{\"a}rhi and Antti R{\"a}is{\"a}nen",

year = "2015",

language = "English",

booktitle = "Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015",

note = "26th International Symposium on Space Terahertz Technology ; Conference date: 16-03-2015 Through 18-03-2015",

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Khanal, S, Kiuru, T, Thomas, B, Mallat, J, Pinta, C, Nagel, M, Walber, A, Kangas, V, Perichaud, M, Brandt, M, Närhi, T & Räisänen, A 2015, Characterisation of THz Schottky diodes for MetOp-SG instruments. in Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015., T1-4, 26th International Symposium on Space Terahertz Technology, Cambridge, United States, 16/03/15. <https://www.cfa.harvard.edu/events/2015/isstt2015/proceedings/files/ISSTT2015_T1-4_Khanal_Abstract.pdf>

Characterisation of THz Schottky diodes for MetOp-SG instruments. / Khanal, Subash; Kiuru, Tero; Thomas, Bertrand; Mallat, Juha; Pinta, Christian; Nagel, Mathias; Walber, Achim; Kangas, Ville; Perichaud, Marie; Brandt, Michael; Närhi, Tapani; Räisänen, Antti.

Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015. 2015. T1-4.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

TY - GEN

T1 - Characterisation of THz Schottky diodes for MetOp-SG instruments

AU - Khanal, Subash

AU - Kiuru, Tero

AU - Thomas, Bertrand

AU - Mallat, Juha

AU - Pinta, Christian

AU - Nagel, Mathias

AU - Walber, Achim

AU - Kangas, Ville

AU - Perichaud, Marie

AU - Brandt, Michael

AU - Närhi, Tapani

AU - Räisänen, Antti

PY - 2015

Y1 - 2015

N2 - Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.

AB - Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.

KW - Schottky diodes

KW - characterisation

KW - THz

M3 - Conference article in proceedings

BT - Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015

T2 - 26th International Symposium on Space Terahertz Technology

Y2 - 16 March 2015 through 18 March 2015

ER -