Characterisation of THz Schottky diodes for MetOp-SG instruments

Subash Khanal, Tero Kiuru, Bertrand Thomas, Juha Mallat, Christian Pinta, Mathias Nagel, Achim Walber, Ville Kangas, Marie Perichaud, Michael Brandt, Tapani Närhi, Antti Räisänen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    1 Citation (Scopus)

    Abstract

    Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.
    Original languageEnglish
    Title of host publicationProceedings of the 26th International Symposium on Space Terahertz Technology, 2015
    Number of pages5
    Publication statusPublished - 2015
    MoE publication typeB3 Non-refereed article in conference proceedings
    Event26th International Symposium on Space Terahertz Technology - Cambridge, United States
    Duration: 16 Mar 201518 Mar 2015

    Conference

    Conference26th International Symposium on Space Terahertz Technology
    CountryUnited States
    CityCambridge
    Period16/03/1518/03/15

    Fingerprint

    Schottky diodes
    multipliers
    diodes
    flight instruments
    ice clouds
    thermal simulation
    microwaves
    impedance measurement
    frequency converters
    European Space Agency
    assembly
    modules
    prototypes
    life (durability)
    requirements
    fabrication
    acoustics

    Keywords

    • Schottky diodes
    • characterisation
    • THz

    Cite this

    Khanal, S., Kiuru, T., Thomas, B., Mallat, J., Pinta, C., Nagel, M., ... Räisänen, A. (2015). Characterisation of THz Schottky diodes for MetOp-SG instruments. In Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015 [T1-4]
    Khanal, Subash ; Kiuru, Tero ; Thomas, Bertrand ; Mallat, Juha ; Pinta, Christian ; Nagel, Mathias ; Walber, Achim ; Kangas, Ville ; Perichaud, Marie ; Brandt, Michael ; Närhi, Tapani ; Räisänen, Antti. / Characterisation of THz Schottky diodes for MetOp-SG instruments. Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015. 2015.
    @inproceedings{efeb809cbc024289a79b6c8f44a7ad3f,
    title = "Characterisation of THz Schottky diodes for MetOp-SG instruments",
    abstract = "Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.",
    keywords = "Schottky diodes, characterisation, THz",
    author = "Subash Khanal and Tero Kiuru and Bertrand Thomas and Juha Mallat and Christian Pinta and Mathias Nagel and Achim Walber and Ville Kangas and Marie Perichaud and Michael Brandt and Tapani N{\"a}rhi and Antti R{\"a}is{\"a}nen",
    year = "2015",
    language = "English",
    booktitle = "Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015",

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    Khanal, S, Kiuru, T, Thomas, B, Mallat, J, Pinta, C, Nagel, M, Walber, A, Kangas, V, Perichaud, M, Brandt, M, Närhi, T & Räisänen, A 2015, Characterisation of THz Schottky diodes for MetOp-SG instruments. in Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015., T1-4, 26th International Symposium on Space Terahertz Technology, Cambridge, United States, 16/03/15.

    Characterisation of THz Schottky diodes for MetOp-SG instruments. / Khanal, Subash; Kiuru, Tero; Thomas, Bertrand; Mallat, Juha; Pinta, Christian; Nagel, Mathias; Walber, Achim; Kangas, Ville; Perichaud, Marie; Brandt, Michael; Närhi, Tapani; Räisänen, Antti.

    Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015. 2015. T1-4.

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    TY - GEN

    T1 - Characterisation of THz Schottky diodes for MetOp-SG instruments

    AU - Khanal, Subash

    AU - Kiuru, Tero

    AU - Thomas, Bertrand

    AU - Mallat, Juha

    AU - Pinta, Christian

    AU - Nagel, Mathias

    AU - Walber, Achim

    AU - Kangas, Ville

    AU - Perichaud, Marie

    AU - Brandt, Michael

    AU - Närhi, Tapani

    AU - Räisänen, Antti

    PY - 2015

    Y1 - 2015

    N2 - Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.

    AB - Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.

    KW - Schottky diodes

    KW - characterisation

    KW - THz

    M3 - Conference article in proceedings

    BT - Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015

    ER -

    Khanal S, Kiuru T, Thomas B, Mallat J, Pinta C, Nagel M et al. Characterisation of THz Schottky diodes for MetOp-SG instruments. In Proceedings of the 26th International Symposium on Space Terahertz Technology, 2015. 2015. T1-4