Characterisation of THz Schottky diodes for MetOp-SG instruments

Subash Khanal, Tero Kiuru, Bertrand Thomas, Juha Mallat, Christian Pinta, Mathias Nagel, Achim Walber, Ville Kangas, Marie Perichaud, Michael Brandt, Tapani Närhi, Antti Räisänen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    1 Citation (Scopus)

    Abstract

    Schottky diode technology is used for frequency conversion and generation in three of the mm-wave and THz instruments on-board the European Space Agency's MetOp-SG satellites. The instruments are MWS (MicroWave Sounder), MWI (Microwave Imager) and ICI (Ice Cloud Imager). In order to ensure the storage and operational life time in addition to performance requirements, reliability assessment for the diodes is performed well before the fabrication of the instruments flight models. This paper presents the thermal characterisation of Schottky diodes used in the instruments as a part of reliability assessment process. Different multiplier and mixer prototype modules have been developed and thermally tested. In addition, thermal simulations are also carried out for comparison with the measurement results. Furthermore, thermal measurements on several identical multiplier blocks are also made that provides information on reproducibility of the assembly of discrete RF devices from the thermal perspective. Finally, some RF measurements are also carried out for comparison to the thermal impedance measurement results made on the same block and the same diodes.
    Original languageEnglish
    Title of host publicationProceedings of the 26th International Symposium on Space Terahertz Technology, 2015
    PublisherHarvard-Smithsonian Center for Astrophysics
    Number of pages5
    Publication statusPublished - 2015
    MoE publication typeB3 Non-refereed article in conference proceedings
    Event26th International Symposium on Space Terahertz Technology - Cambridge, United States
    Duration: 16 Mar 201518 Mar 2015

    Conference

    Conference26th International Symposium on Space Terahertz Technology
    Country/TerritoryUnited States
    CityCambridge
    Period16/03/1518/03/15

    Keywords

    • Schottky diodes
    • characterisation
    • THz

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