Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures
- Arnout Beckers*
- , Farzan Jazaeri
- , Heorhii Bohuslavskyi
- , Louis Hutin
- , Silvano De Franceschi
- , Christian Enz
*Corresponding author for this work
- Ecole Polytechnique Fédérale de Lausanne (EPFL)
- Laboratoire d'électronique des technologies de l'information (LETI)
Research output: Contribution to journal › Article › Scientific › peer-review
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