Characterization and Modelling of THz Schottky Diodes

Tero Kiuru

doi:10.1109/IRMMW-THz.2014.6956306

Characterization and Modelling of THz Schottky Diodes

Tero Kiuru

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

3 Citations (Scopus)

Abstract

Efficient characterization and modelling techniques have a key role in the development of Schottky diode-based devices with state-of-the-art performance. This paper makes an effort to introduce such techniques and to provide examples of how they are used by the Schottky community. The modelling techniques covered in the paper are circuit simulator and electro-magnetic modelling. Characterization methods include current-voltage, capacitance-voltage, S-parameter, test jig-based, and thermal measurement techniques.

Original language	English
Title of host publication	Proceedings
Subtitle of host publication	39th International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz, 2014
Publisher	IEEE Institute of Electrical and Electronic Engineers
Number of pages	3
ISBN (Electronic)	978-1-4799-3877-3
DOIs	https://doi.org/10.1109/IRMMW-THz.2014.6956306
Publication status	Published - 2014
MoE publication type	A4 Article in a conference publication
Event	39th International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2014 - Tucson, AZ, United States Duration: 14 Sept 2014 → 19 Sept 2014

Conference

Conference	39th International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2014
Abbreviated title	IRMMW-THz 2014
Country/Territory	United States
City	Tucson, AZ
Period	14/09/14 → 19/09/14

Keywords

schottky diodes
characterisation
THz
modelling

Access to Document

10.1109/IRMMW-THz.2014.6956306

Cite this

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title = "Characterization and Modelling of THz Schottky Diodes",

abstract = "Efficient characterization and modelling techniques have a key role in the development of Schottky diode-based devices with state-of-the-art performance. This paper makes an effort to introduce such techniques and to provide examples of how they are used by the Schottky community. The modelling techniques covered in the paper are circuit simulator and electro-magnetic modelling. Characterization methods include current-voltage, capacitance-voltage, S-parameter, test jig-based, and thermal measurement techniques.",

keywords = "schottky diodes, characterisation, THz, modelling",

author = "Tero Kiuru",

year = "2014",

doi = "10.1109/IRMMW-THz.2014.6956306",

language = "English",

booktitle = "Proceedings",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "39th International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2014, IRMMW-THz 2014 ; Conference date: 14-09-2014 Through 19-09-2014",

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Kiuru, T 2014, Characterization and Modelling of THz Schottky Diodes. in Proceedings: 39th International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz, 2014. IEEE Institute of Electrical and Electronic Engineers, 39th International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2014, Tucson, AZ, United States, 14/09/14. https://doi.org/10.1109/IRMMW-THz.2014.6956306

TY - GEN

T1 - Characterization and Modelling of THz Schottky Diodes

AU - Kiuru, Tero

PY - 2014

Y1 - 2014

N2 - Efficient characterization and modelling techniques have a key role in the development of Schottky diode-based devices with state-of-the-art performance. This paper makes an effort to introduce such techniques and to provide examples of how they are used by the Schottky community. The modelling techniques covered in the paper are circuit simulator and electro-magnetic modelling. Characterization methods include current-voltage, capacitance-voltage, S-parameter, test jig-based, and thermal measurement techniques.

AB - Efficient characterization and modelling techniques have a key role in the development of Schottky diode-based devices with state-of-the-art performance. This paper makes an effort to introduce such techniques and to provide examples of how they are used by the Schottky community. The modelling techniques covered in the paper are circuit simulator and electro-magnetic modelling. Characterization methods include current-voltage, capacitance-voltage, S-parameter, test jig-based, and thermal measurement techniques.

KW - schottky diodes

KW - characterisation

KW - THz

KW - modelling

U2 - 10.1109/IRMMW-THz.2014.6956306

DO - 10.1109/IRMMW-THz.2014.6956306

M3 - Conference article in proceedings

BT - Proceedings

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 39th International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2014

Y2 - 14 September 2014 through 19 September 2014

ER -

Characterization and Modelling of THz Schottky Diodes

Abstract

Conference

Keywords

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