Characterization of dielectric properties of insulating materials for use in an HVDC reference divider

A. P. Elg, M. Kharezy, A. Bergman, J. Hällström

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

3 Citations (Scopus)

Abstract

Dielectric properties of polyethylene (PE), polyoxymethylene (POM) and ceramic glass (MACOR) are compared. Their suitability to act as a support for a resistor chain in a wideband HVDC reference divider is characterized. The support material forms a parallel capacitance to the resistive resistor chain, and a bandwidth of more than 100 kHz is needed. The frequency dependence of dielectric constant has been measured in the range 20 - 100 kHz. The depolarization current of these materials was measured to be at least 6 orders of magnitude lower than the current through the resistive chain. Neither MACOR nor PE does build up space charge which POM does. Possessing the highest dielectric constant makes MACOR well suited for the application.

Original languageEnglish
Title of host publication2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages80-81
Number of pages2
ISBN (Electronic)978-1-4673-0442-9
ISBN (Print)978-1-4673-0439-9
DOIs
Publication statusPublished - 3 Oct 2012
MoE publication typeA4 Article in a conference publication
Event2012 Conference on Precision Electromagnetic Measurements, CPEM 2012 - Washington, DC, United States
Duration: 1 Jul 20126 Jul 2012

Conference

Conference2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
CountryUnited States
CityWashington, DC
Period1/07/126/07/12

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Keywords

  • current measurement
  • dielectric
  • high-voltage techniques
  • HVDC
  • metrology

Cite this

Elg, A. P., Kharezy, M., Bergman, A., & Hällström, J. (2012). Characterization of dielectric properties of insulating materials for use in an HVDC reference divider. In 2012 Conference on Precision Electromagnetic Measurements, CPEM 2012 (pp. 80-81). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/CPEM.2012.6250670