Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements

  • Sakari Sintonen
  • , Sami Suihkonen
  • , Olli Svensk
  • , Pekka Tuomas Törmä
  • , Muhammad Ali
  • , Markku Sopanen
  • , Harri Lipsanen

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)1790-1793
Number of pages4
JournalPhysica Status Solidi C: Current Topics in Solid State Physics
Volume7
Issue number7-8
DOIs
Publication statusPublished - Jul 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • III-V nitides
  • simulation
  • superlattices
  • X-ray refletivity
  • X-ray scattering

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