Characterization of interconnects on multilayer high frequency PCB for D-band

Antti Lamminen, Markku Lahti, David Del Rio, Jussi Saily, Juan F. Sevillano, Vladimir Ermolov

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    13 Citations (Scopus)
    311 Downloads (Pure)

    Abstract

    The paper presents the characterization of interconnects for D-band on multilayer high frequency PCBs. The losses demonstrated at 150 GHz for a microstrip line, a coplanar waveguide and a single flip-chip transition are 1.9 dB/cm, 1.8 dB/cm and 0.3 dB (for 60 μm bumps), respectively. The applicability of multilayer high frequency PCB technology as a low cost integration platform for D-band is proven.

    Original languageEnglish
    Title of host publication2nd 6G Wireless Summit 2020
    Subtitle of host publicationGain Edge for the 6G Era, 6G SUMMIT 2020
    PublisherIEEE Institute of Electrical and Electronic Engineers
    ISBN (Electronic)978-1-7281-6047-4, 978-1-7281-6046-7
    ISBN (Print)978-1-7281-6048-1
    DOIs
    Publication statusPublished - Mar 2020
    MoE publication typeA4 Article in a conference publication
    Event2nd 6G Wireless Summit, 6G SUMMIT 2020 - Levi, Lapland, Finland
    Duration: 17 Mar 202020 Mar 2020

    Conference

    Conference2nd 6G Wireless Summit, 6G SUMMIT 2020
    Country/TerritoryFinland
    CityLevi, Lapland
    Period17/03/2020/03/20

    Funding

    This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement No 761390.

    Keywords

    • D-band
    • Flip-chip interconnect
    • Integration
    • Interconnect
    • Mm-waves
    • PCB

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