Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationSecondary Ion Mass Spectrometry, SIMS IX
    Subtitle of host publicationproceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)
    PublisherWiley-Blackwell
    Pages531-534
    ISBN (Electronic)978-0471942184
    ISBN (Print)0471942189
    Publication statusPublished - 20 Sep 1994
    MoE publication typeNot Eligible
    EventNinth International Conference on Secondary Ion Mass Spectrometry, SIMS IX - Yokohama, Japan
    Duration: 7 Nov 199312 Nov 1993

    Conference

    ConferenceNinth International Conference on Secondary Ion Mass Spectrometry, SIMS IX
    Abbreviated titleSIMS IX
    CountryJapan
    CityYokohama
    Period7/11/9312/11/93

    Keywords

    • Josephson junction

    Cite this

    Likonen, J., Saarilahti, J., Grönberg, L., & Kiviranta, M. (1994). Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. In Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) (pp. 531-534). Wiley-Blackwell.
    Likonen, Jari ; Saarilahti, J. ; Grönberg, Leif ; Kiviranta, Mikko. / Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, 1994. pp. 531-534
    @inproceedings{7591e238d8ef4533aac3ee1a030cd76a,
    title = "Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy",
    keywords = "Josephson junction",
    author = "Jari Likonen and J. Saarilahti and Leif Gr{\"o}nberg and Mikko Kiviranta",
    note = "Project : KET 4237",
    year = "1994",
    month = "9",
    day = "20",
    language = "English",
    isbn = "0471942189",
    pages = "531--534",
    booktitle = "Secondary Ion Mass Spectrometry, SIMS IX",
    publisher = "Wiley-Blackwell",
    address = "United States",

    }

    Likonen, J, Saarilahti, J, Grönberg, L & Kiviranta, M 1994, Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. in Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, pp. 531-534, Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX, Yokohama, Japan, 7/11/93.

    Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. / Likonen, Jari; Saarilahti, J.; Grönberg, Leif; Kiviranta, Mikko.

    Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, 1994. p. 531-534.

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    TY - GEN

    T1 - Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

    AU - Likonen, Jari

    AU - Saarilahti, J.

    AU - Grönberg, Leif

    AU - Kiviranta, Mikko

    N1 - Project : KET 4237

    PY - 1994/9/20

    Y1 - 1994/9/20

    KW - Josephson junction

    M3 - Conference article in proceedings

    SN - 0471942189

    SP - 531

    EP - 534

    BT - Secondary Ion Mass Spectrometry, SIMS IX

    PB - Wiley-Blackwell

    ER -

    Likonen J, Saarilahti J, Grönberg L, Kiviranta M. Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. In Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell. 1994. p. 531-534