Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

Jari Likonen; J. Saarilahti; Leif Grönberg; Mikko Kiviranta

Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

Jari Likonen, J. Saarilahti, Leif Grönberg, Mikko Kiviranta

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Secondary Ion Mass Spectrometry, SIMS IX
Subtitle of host publication	proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)
Publisher	Wiley-Blackwell
Pages	531-534
ISBN (Electronic)	978-0471942184
ISBN (Print)	0471942189
Publication status	Published - 20 Sept 1994
MoE publication type	Not Eligible
Event	Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX - Yokohama, Japan Duration: 7 Nov 1993 → 12 Nov 1993

Conference

Conference	Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX
Abbreviated title	SIMS IX
Country/Territory	Japan
City	Yokohama
Period	7/11/93 → 12/11/93

Keywords

Josephson junction

Cite this

@inproceedings{7591e238d8ef4533aac3ee1a030cd76a,

title = "Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy",

keywords = "Josephson junction",

author = "Jari Likonen and J. Saarilahti and Leif Gr{\"o}nberg and Mikko Kiviranta",

note = "Project : KET 4237; Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX, SIMS IX ; Conference date: 07-11-1993 Through 12-11-1993",

year = "1994",

month = sep,

day = "20",

language = "English",

isbn = "0471942189",

pages = "531--534",

booktitle = "Secondary Ion Mass Spectrometry, SIMS IX",

publisher = "Wiley-Blackwell",

address = "United States",

}

Likonen, J, Saarilahti, J, Grönberg, L & Kiviranta, M 1994, Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. in Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, pp. 531-534, Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX, Yokohama, Japan, 7/11/93.

Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. / Likonen, Jari; Saarilahti, J.; Grönberg, Leif et al.
Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, 1994. p. 531-534.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

AU - Likonen, Jari

AU - Saarilahti, J.

AU - Grönberg, Leif

AU - Kiviranta, Mikko

N1 - Project : KET 4237

PY - 1994/9/20

Y1 - 1994/9/20

KW - Josephson junction

M3 - Conference article in proceedings

SN - 0471942189

SP - 531

EP - 534

BT - Secondary Ion Mass Spectrometry, SIMS IX

PB - Wiley-Blackwell

T2 - Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX

Y2 - 7 November 1993 through 12 November 1993

ER -