Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationSecondary Ion Mass Spectrometry, SIMS IX
Subtitle of host publicationproceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)
PublisherWiley-Blackwell
Pages531-534
ISBN (Electronic)978-0471942184
ISBN (Print)0471942189
Publication statusPublished - 20 Sep 1994
MoE publication typeNot Eligible
EventNinth International Conference on Secondary Ion Mass Spectrometry, SIMS IX - Yokohama, Japan
Duration: 7 Nov 199312 Nov 1993

Conference

ConferenceNinth International Conference on Secondary Ion Mass Spectrometry, SIMS IX
Abbreviated titleSIMS IX
CountryJapan
CityYokohama
Period7/11/9312/11/93

Keywords

  • Josephson junction

Cite this

Likonen, J., Saarilahti, J., Grönberg, L., & Kiviranta, M. (1994). Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. In Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) (pp. 531-534). Wiley-Blackwell.
Likonen, Jari ; Saarilahti, J. ; Grönberg, Leif ; Kiviranta, Mikko. / Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, 1994. pp. 531-534
@inproceedings{7591e238d8ef4533aac3ee1a030cd76a,
title = "Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy",
keywords = "Josephson junction",
author = "Jari Likonen and J. Saarilahti and Leif Gr{\"o}nberg and Mikko Kiviranta",
note = "Project : KET 4237",
year = "1994",
month = "9",
day = "20",
language = "English",
isbn = "0471942189",
pages = "531--534",
booktitle = "Secondary Ion Mass Spectrometry, SIMS IX",
publisher = "Wiley-Blackwell",
address = "United States",

}

Likonen, J, Saarilahti, J, Grönberg, L & Kiviranta, M 1994, Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. in Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, pp. 531-534, Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX, Yokohama, Japan, 7/11/93.

Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. / Likonen, Jari; Saarilahti, J.; Grönberg, Leif; Kiviranta, Mikko.

Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell, 1994. p. 531-534.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

TY - GEN

T1 - Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

AU - Likonen, Jari

AU - Saarilahti, J.

AU - Grönberg, Leif

AU - Kiviranta, Mikko

N1 - Project : KET 4237

PY - 1994/9/20

Y1 - 1994/9/20

KW - Josephson junction

M3 - Conference article in proceedings

SN - 0471942189

SP - 531

EP - 534

BT - Secondary Ion Mass Spectrometry, SIMS IX

PB - Wiley-Blackwell

ER -

Likonen J, Saarilahti J, Grönberg L, Kiviranta M. Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. In Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX). Wiley-Blackwell. 1994. p. 531-534