Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationSecondary Ion Mass Spectrometry, SIMS IX
    Subtitle of host publicationproceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)
    PublisherWiley-Blackwell
    Pages531-534
    ISBN (Electronic)978-0471942184
    ISBN (Print)0471942189
    Publication statusPublished - 20 Sep 1994
    MoE publication typeNot Eligible
    EventNinth International Conference on Secondary Ion Mass Spectrometry, SIMS IX - Yokohama, Japan
    Duration: 7 Nov 199312 Nov 1993

    Conference

    ConferenceNinth International Conference on Secondary Ion Mass Spectrometry, SIMS IX
    Abbreviated titleSIMS IX
    CountryJapan
    CityYokohama
    Period7/11/9312/11/93

    Keywords

    • Josephson junction

    Cite this

    Likonen, J., Saarilahti, J., Grönberg, L., & Kiviranta, M. (1994). Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy. In Secondary Ion Mass Spectrometry, SIMS IX: proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) (pp. 531-534). Wiley-Blackwell.