Skip to main navigation Skip to search Skip to main content

Characterization of Ni/SnPb-TiW/Pt flip chip interconnections in silicon pixel detector modules

  • A. Karadzhinova*
  • , A. Nolvi
  • , Jaakko Härkönen
  • , Panja Luukka
  • , Teppo Mäenpää
  • , Eija Tuominen
  • , E. Hæggström
  • , Juha Kalliopuska
  • , S. Vähänen
  • , I. Kassamakov
  • *Corresponding author for this work
  • University of Helsinki
  • Advacam Oy

Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

Fingerprint

Dive into the research topics of 'Characterization of Ni/SnPb-TiW/Pt flip chip interconnections in silicon pixel detector modules'. Together they form a unique fingerprint.
Sort by

Keyphrases

INIS

Engineering