Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix

S. Virtanen, T. Kortelainen, S. Ahonen, V. Koivu, M. Lahtinen, E. Arola, Satu Kortet, Mikko Karttunen, K. Kannus, M. Pettersson

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

Abstract

POSS-based (polyhedral oligomeric silsesquioxane) materials, including biomaterials, dielectric materials, organic light-emitting diodes, lithography resists, catalysts, membrane fuel cells, and battery membranes have recently been introduced [1]. In nanocomposites, advantageous changes of the materials properties, are usually connected to the filler particle's surface properties and interfacial interactions because of the large surface-area-to-volume ratio of the filling material. Yet, properties such as structure and orientation of the filler in the polymer matrix may play a crucial role in understanding the whole subject. The octamethyl-POSS (om-POSS) [(CH3)8Si8O12] filler material has been shown to have ability to substantially increase the breakdown strength of polypropylene (PP) [2]. The results of the relative permittivity, loss factor and volume resistivity measurements indicate that om-POSS additives could improve the dielectric properties of PP. In this work multi-level characterization of om-POSS fillers in composite material is performed using X-ray tomography, powder diffraction, transmission electron microscopy and micro-Raman facilities at the University of Jyväskylä. The detailed analysis of micro-Raman measurements is done at Tampere University of Technology using electron-scale ab initio density functional theory (DFT) based methods. All polymer nanocomposite samples have been developed at the Technical Research Centre of Finland (VTT). The research has been funded by the Tekes consortium project NANOCOM.
Original languageEnglish
Title of host publicationProceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11
Place of PublicationTampere
PublisherTampere University of Technology
Pages195-198
ISBN (Electronic)978-952-15-2563-6
ISBN (Print)978-952-15-2562-9
Publication statusPublished - 2011
MoE publication typeB3 Non-refereed article in conference proceedings
Event22nd Nordic Insulation Symposium NORD-IS 11 - Tampere, Finland
Duration: 13 Jun 201115 Jun 2011

Conference

Conference22nd Nordic Insulation Symposium NORD-IS 11
Abbreviated titleNORD-IS 11
CountryFinland
CityTampere
Period13/06/1115/06/11

Fingerprint

fillers
matrices
polypropylene
nanocomposites
membranes
Finland
polymers
surface properties
fuel cells
electric batteries
dielectric properties
light emitting diodes
lithography
tomography
breakdown
permittivity
density functional theory
catalysts
transmission electron microscopy
electrical resistivity

Keywords

  • Silsesquioxane
  • polypropylene
  • dielectric break down

Cite this

Virtanen, S., Kortelainen, T., Ahonen, S., Koivu, V., Lahtinen, M., Arola, E., ... Pettersson, M. (2011). Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix. In Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11 (pp. 195-198). Tampere: Tampere University of Technology.
Virtanen, S. ; Kortelainen, T. ; Ahonen, S. ; Koivu, V. ; Lahtinen, M. ; Arola, E. ; Kortet, Satu ; Karttunen, Mikko ; Kannus, K. ; Pettersson, M. / Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix. Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11. Tampere : Tampere University of Technology, 2011. pp. 195-198
@inproceedings{182179474a404a31bbade163a01f9f14,
title = "Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix",
abstract = "POSS-based (polyhedral oligomeric silsesquioxane) materials, including biomaterials, dielectric materials, organic light-emitting diodes, lithography resists, catalysts, membrane fuel cells, and battery membranes have recently been introduced [1]. In nanocomposites, advantageous changes of the materials properties, are usually connected to the filler particle's surface properties and interfacial interactions because of the large surface-area-to-volume ratio of the filling material. Yet, properties such as structure and orientation of the filler in the polymer matrix may play a crucial role in understanding the whole subject. The octamethyl-POSS (om-POSS) [(CH3)8Si8O12] filler material has been shown to have ability to substantially increase the breakdown strength of polypropylene (PP) [2]. The results of the relative permittivity, loss factor and volume resistivity measurements indicate that om-POSS additives could improve the dielectric properties of PP. In this work multi-level characterization of om-POSS fillers in composite material is performed using X-ray tomography, powder diffraction, transmission electron microscopy and micro-Raman facilities at the University of Jyv{\"a}skyl{\"a}. The detailed analysis of micro-Raman measurements is done at Tampere University of Technology using electron-scale ab initio density functional theory (DFT) based methods. All polymer nanocomposite samples have been developed at the Technical Research Centre of Finland (VTT). The research has been funded by the Tekes consortium project NANOCOM.",
keywords = "Silsesquioxane, polypropylene, dielectric break down",
author = "S. Virtanen and T. Kortelainen and S. Ahonen and V. Koivu and M. Lahtinen and E. Arola and Satu Kortet and Mikko Karttunen and K. Kannus and M. Pettersson",
year = "2011",
language = "English",
isbn = "978-952-15-2562-9",
pages = "195--198",
booktitle = "Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11",
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Virtanen, S, Kortelainen, T, Ahonen, S, Koivu, V, Lahtinen, M, Arola, E, Kortet, S, Karttunen, M, Kannus, K & Pettersson, M 2011, Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix. in Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11. Tampere University of Technology, Tampere, pp. 195-198, 22nd Nordic Insulation Symposium NORD-IS 11, Tampere, Finland, 13/06/11.

Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix. / Virtanen, S.; Kortelainen, T.; Ahonen, S.; Koivu, V.; Lahtinen, M.; Arola, E.; Kortet, Satu; Karttunen, Mikko; Kannus, K.; Pettersson, M.

Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11. Tampere : Tampere University of Technology, 2011. p. 195-198.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

TY - GEN

T1 - Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix

AU - Virtanen, S.

AU - Kortelainen, T.

AU - Ahonen, S.

AU - Koivu, V.

AU - Lahtinen, M.

AU - Arola, E.

AU - Kortet, Satu

AU - Karttunen, Mikko

AU - Kannus, K.

AU - Pettersson, M.

PY - 2011

Y1 - 2011

N2 - POSS-based (polyhedral oligomeric silsesquioxane) materials, including biomaterials, dielectric materials, organic light-emitting diodes, lithography resists, catalysts, membrane fuel cells, and battery membranes have recently been introduced [1]. In nanocomposites, advantageous changes of the materials properties, are usually connected to the filler particle's surface properties and interfacial interactions because of the large surface-area-to-volume ratio of the filling material. Yet, properties such as structure and orientation of the filler in the polymer matrix may play a crucial role in understanding the whole subject. The octamethyl-POSS (om-POSS) [(CH3)8Si8O12] filler material has been shown to have ability to substantially increase the breakdown strength of polypropylene (PP) [2]. The results of the relative permittivity, loss factor and volume resistivity measurements indicate that om-POSS additives could improve the dielectric properties of PP. In this work multi-level characterization of om-POSS fillers in composite material is performed using X-ray tomography, powder diffraction, transmission electron microscopy and micro-Raman facilities at the University of Jyväskylä. The detailed analysis of micro-Raman measurements is done at Tampere University of Technology using electron-scale ab initio density functional theory (DFT) based methods. All polymer nanocomposite samples have been developed at the Technical Research Centre of Finland (VTT). The research has been funded by the Tekes consortium project NANOCOM.

AB - POSS-based (polyhedral oligomeric silsesquioxane) materials, including biomaterials, dielectric materials, organic light-emitting diodes, lithography resists, catalysts, membrane fuel cells, and battery membranes have recently been introduced [1]. In nanocomposites, advantageous changes of the materials properties, are usually connected to the filler particle's surface properties and interfacial interactions because of the large surface-area-to-volume ratio of the filling material. Yet, properties such as structure and orientation of the filler in the polymer matrix may play a crucial role in understanding the whole subject. The octamethyl-POSS (om-POSS) [(CH3)8Si8O12] filler material has been shown to have ability to substantially increase the breakdown strength of polypropylene (PP) [2]. The results of the relative permittivity, loss factor and volume resistivity measurements indicate that om-POSS additives could improve the dielectric properties of PP. In this work multi-level characterization of om-POSS fillers in composite material is performed using X-ray tomography, powder diffraction, transmission electron microscopy and micro-Raman facilities at the University of Jyväskylä. The detailed analysis of micro-Raman measurements is done at Tampere University of Technology using electron-scale ab initio density functional theory (DFT) based methods. All polymer nanocomposite samples have been developed at the Technical Research Centre of Finland (VTT). The research has been funded by the Tekes consortium project NANOCOM.

KW - Silsesquioxane

KW - polypropylene

KW - dielectric break down

M3 - Conference article in proceedings

SN - 978-952-15-2562-9

SP - 195

EP - 198

BT - Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11

PB - Tampere University of Technology

CY - Tampere

ER -

Virtanen S, Kortelainen T, Ahonen S, Koivu V, Lahtinen M, Arola E et al. Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix. In Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11. Tampere: Tampere University of Technology. 2011. p. 195-198