Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 2273 - 2276 |
| Number of pages | 4 |
| Journal | Journal of the European Ceramic Society |
| Volume | 25 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 2005 |
| MoE publication type | A1 Journal article-refereed |
Fingerprint
Keywords
- films
- grain size
- optical properties
- PZT
- lead-zirconate-titanate
- electro-optics
Cite this
}
Characterization of optical properties of nanocrystalline doped PZT thin films. / Lappalainen, Jyrki (Corresponding Author); Hiltunen, Jussi; Lantto, Vilho.
In: Journal of the European Ceramic Society, Vol. 25, No. 12, 2005, p. 2273 - 2276.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Characterization of optical properties of nanocrystalline doped PZT thin films
AU - Lappalainen, Jyrki
AU - Hiltunen, Jussi
AU - Lantto, Vilho
PY - 2005
Y1 - 2005
N2 - High optical transmittance and refractive index together with strong electro-optic Kerr effect of the ferroelectric lead-zirconate-titanate (PZT) films can be utilized in various active optical applications like optical shutters, modulators and waveguides. Pulsed laser deposition (PLD) with XeCl-excimer laser with a wavelength of 308 nm and Nd-modified PZT target were used for the optical thin film fabrication. The films were deposited on single-crystal MgO (1 0 0) substrates. The crystal structure and grain size distribution were studied using XRD technique. The optical transmission spectra of the films were measured at UV–vis–NIR wavelengths, which was utilized to obtain the refraction index n dispersion, extinction coefficient k, and the value of the band gap Eg. Electro-optic coefficients were determined by ellipsometric technique. In the case of polycrystalline films, mean grain size was between 9 and 20 nm. At the wavelength of 633 nm the refractive index varied from 2.28 to 2.46 as a function of mean grain size. Also, the electro-optic coefficient showed dependence on grain size distribution increasing from 0.37 × 10−18 to 2.49 × 10−18 m2/V2 with increasing mean grain size.
AB - High optical transmittance and refractive index together with strong electro-optic Kerr effect of the ferroelectric lead-zirconate-titanate (PZT) films can be utilized in various active optical applications like optical shutters, modulators and waveguides. Pulsed laser deposition (PLD) with XeCl-excimer laser with a wavelength of 308 nm and Nd-modified PZT target were used for the optical thin film fabrication. The films were deposited on single-crystal MgO (1 0 0) substrates. The crystal structure and grain size distribution were studied using XRD technique. The optical transmission spectra of the films were measured at UV–vis–NIR wavelengths, which was utilized to obtain the refraction index n dispersion, extinction coefficient k, and the value of the band gap Eg. Electro-optic coefficients were determined by ellipsometric technique. In the case of polycrystalline films, mean grain size was between 9 and 20 nm. At the wavelength of 633 nm the refractive index varied from 2.28 to 2.46 as a function of mean grain size. Also, the electro-optic coefficient showed dependence on grain size distribution increasing from 0.37 × 10−18 to 2.49 × 10−18 m2/V2 with increasing mean grain size.
KW - films
KW - grain size
KW - optical properties
KW - PZT
KW - lead-zirconate-titanate
KW - electro-optics
U2 - 10.1016/j.jeurceramsoc.2005.03.044
DO - 10.1016/j.jeurceramsoc.2005.03.044
M3 - Article
VL - 25
SP - 2273
EP - 2276
JO - Journal of the European Ceramic Society
JF - Journal of the European Ceramic Society
SN - 0955-2219
IS - 12
ER -