Characterization of optical properties of nanocrystalline doped PZT thin films

Jyrki Lappalainen (Corresponding Author), Jussi Hiltunen, Vilho Lantto

Research output: Contribution to journalArticleScientificpeer-review

18 Citations (Scopus)

Abstract

High optical transmittance and refractive index together with strong electro-optic Kerr effect of the ferroelectric lead-zirconate-titanate (PZT) films can be utilized in various active optical applications like optical shutters, modulators and waveguides. Pulsed laser deposition (PLD) with XeCl-excimer laser with a wavelength of 308 nm and Nd-modified PZT target were used for the optical thin film fabrication. The films were deposited on single-crystal MgO (1 0 0) substrates. The crystal structure and grain size distribution were studied using XRD technique. The optical transmission spectra of the films were measured at UV–vis–NIR wavelengths, which was utilized to obtain the refraction index n dispersion, extinction coefficient k, and the value of the band gap Eg. Electro-optic coefficients were determined by ellipsometric technique. In the case of polycrystalline films, mean grain size was between 9 and 20 nm. At the wavelength of 633 nm the refractive index varied from 2.28 to 2.46 as a function of mean grain size. Also, the electro-optic coefficient showed dependence on grain size distribution increasing from 0.37 × 10−18 to 2.49 × 10−18 m2/V2 with increasing mean grain size.
Original languageEnglish
Pages (from-to)2273 - 2276
Number of pages4
JournalJournal of the European Ceramic Society
Volume25
Issue number12
DOIs
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

Fingerprint

Electrooptical effects
Optical properties
Thin films
Wavelength
Refractive index
Optical shutters
Optical films
Opacity
Excimer lasers
Pulsed laser deposition
Light transmission
Refraction
Modulators
Ferroelectric materials
Energy gap
Waveguides
Lead
Crystal structure
Single crystals
Fabrication

Keywords

  • films
  • grain size
  • optical properties
  • PZT
  • lead-zirconate-titanate
  • electro-optics

Cite this

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title = "Characterization of optical properties of nanocrystalline doped PZT thin films",
abstract = "High optical transmittance and refractive index together with strong electro-optic Kerr effect of the ferroelectric lead-zirconate-titanate (PZT) films can be utilized in various active optical applications like optical shutters, modulators and waveguides. Pulsed laser deposition (PLD) with XeCl-excimer laser with a wavelength of 308 nm and Nd-modified PZT target were used for the optical thin film fabrication. The films were deposited on single-crystal MgO (1 0 0) substrates. The crystal structure and grain size distribution were studied using XRD technique. The optical transmission spectra of the films were measured at UV–vis–NIR wavelengths, which was utilized to obtain the refraction index n dispersion, extinction coefficient k, and the value of the band gap Eg. Electro-optic coefficients were determined by ellipsometric technique. In the case of polycrystalline films, mean grain size was between 9 and 20 nm. At the wavelength of 633 nm the refractive index varied from 2.28 to 2.46 as a function of mean grain size. Also, the electro-optic coefficient showed dependence on grain size distribution increasing from 0.37 × 10−18 to 2.49 × 10−18 m2/V2 with increasing mean grain size.",
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author = "Jyrki Lappalainen and Jussi Hiltunen and Vilho Lantto",
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}

Characterization of optical properties of nanocrystalline doped PZT thin films. / Lappalainen, Jyrki (Corresponding Author); Hiltunen, Jussi; Lantto, Vilho.

In: Journal of the European Ceramic Society, Vol. 25, No. 12, 2005, p. 2273 - 2276.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Characterization of optical properties of nanocrystalline doped PZT thin films

AU - Lappalainen, Jyrki

AU - Hiltunen, Jussi

AU - Lantto, Vilho

PY - 2005

Y1 - 2005

N2 - High optical transmittance and refractive index together with strong electro-optic Kerr effect of the ferroelectric lead-zirconate-titanate (PZT) films can be utilized in various active optical applications like optical shutters, modulators and waveguides. Pulsed laser deposition (PLD) with XeCl-excimer laser with a wavelength of 308 nm and Nd-modified PZT target were used for the optical thin film fabrication. The films were deposited on single-crystal MgO (1 0 0) substrates. The crystal structure and grain size distribution were studied using XRD technique. The optical transmission spectra of the films were measured at UV–vis–NIR wavelengths, which was utilized to obtain the refraction index n dispersion, extinction coefficient k, and the value of the band gap Eg. Electro-optic coefficients were determined by ellipsometric technique. In the case of polycrystalline films, mean grain size was between 9 and 20 nm. At the wavelength of 633 nm the refractive index varied from 2.28 to 2.46 as a function of mean grain size. Also, the electro-optic coefficient showed dependence on grain size distribution increasing from 0.37 × 10−18 to 2.49 × 10−18 m2/V2 with increasing mean grain size.

AB - High optical transmittance and refractive index together with strong electro-optic Kerr effect of the ferroelectric lead-zirconate-titanate (PZT) films can be utilized in various active optical applications like optical shutters, modulators and waveguides. Pulsed laser deposition (PLD) with XeCl-excimer laser with a wavelength of 308 nm and Nd-modified PZT target were used for the optical thin film fabrication. The films were deposited on single-crystal MgO (1 0 0) substrates. The crystal structure and grain size distribution were studied using XRD technique. The optical transmission spectra of the films were measured at UV–vis–NIR wavelengths, which was utilized to obtain the refraction index n dispersion, extinction coefficient k, and the value of the band gap Eg. Electro-optic coefficients were determined by ellipsometric technique. In the case of polycrystalline films, mean grain size was between 9 and 20 nm. At the wavelength of 633 nm the refractive index varied from 2.28 to 2.46 as a function of mean grain size. Also, the electro-optic coefficient showed dependence on grain size distribution increasing from 0.37 × 10−18 to 2.49 × 10−18 m2/V2 with increasing mean grain size.

KW - films

KW - grain size

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KW - lead-zirconate-titanate

KW - electro-optics

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