Abstract
A method for characterization of short photonic crystal waveguides is presented. The method utilizes mirror-enhanced Fabry–Perot resonances in the photonic crystal waveguide as well as in the insertion waveguides on either side of the photonic crystal waveguide. The method is applied to three-row defect (W3) photonic crystal waveguides fabricated into silicon-on-insulator wafers. The results are compared with those obtained with the conventional Fabry–Perot method.
Original language | English |
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Pages (from-to) | S502-S506 |
Number of pages | 5 |
Journal | Journal of Optics A: Pure and Applied Optics |
Volume | 8 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2006 |
MoE publication type | A1 Journal article-refereed |
Keywords
- photonic crystals
- optical waveguides