A method for characterization of short photonic crystal waveguides is presented. The method utilizes mirror-enhanced Fabry–Perot resonances in the photonic crystal waveguide as well as in the insertion waveguides on either side of the photonic crystal waveguide. The method is applied to three-row defect (W3) photonic crystal waveguides fabricated into silicon-on-insulator wafers. The results are compared with those obtained with the conventional Fabry–Perot method.
- photonic crystals
- optical waveguides