Abstract
A method for characterization of short photonic crystal waveguides is presented. The method utilizes mirror-enhanced Fabry–Perot resonances in the photonic crystal waveguide as well as in the insertion waveguides on either side of the photonic crystal waveguide. The method is applied to three-row defect (W3) photonic crystal waveguides fabricated into silicon-on-insulator wafers. The results are compared with those obtained with the conventional Fabry–Perot method.
| Original language | English |
|---|---|
| Pages (from-to) | S502-S506 |
| Number of pages | 5 |
| Journal | Journal of Optics A: Pure and Applied Optics |
| Volume | 8 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 2006 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- photonic crystals
- optical waveguides
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