Characterization of semiconductor water surfaces by light scattering topography

Jyrki Molarius, Hannu Ronkainen, N. Henelius, Olli Anttila, Markku Tilli

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsScientific

    Original languageEnglish
    Title of host publication16th Nordic Semiconductor Meeting. Laugarvatn
    Subtitle of host publicationAbstracts
    EditorsHaflidi P. Gislason, Vidar Gudmundsson, Gerlinde Xander
    Place of PublicationReykjavík
    PublisherUniversity of Iceland
    Pages113
    Publication statusPublished - 1994
    MoE publication typeNot Eligible
    Event16th Nordic Semiconductor Meeting - Laugarvatn, Iceland
    Duration: 12 Jun 199415 Jun 1994

    Conference

    Conference16th Nordic Semiconductor Meeting
    CountryIceland
    CityLaugarvatn
    Period12/06/9415/06/94

    Cite this

    Molarius, J., Ronkainen, H., Henelius, N., Anttila, O., & Tilli, M. (1994). Characterization of semiconductor water surfaces by light scattering topography. In H. P. Gislason, V. Gudmundsson, & G. Xander (Eds.), 16th Nordic Semiconductor Meeting. Laugarvatn: Abstracts (pp. 113). University of Iceland.