TY - JOUR
T1 - Combinatorial study of low-refractive Mg–F–Si–O nano-composites deposited by magnetron co-sputtering from compound targets
AU - Mertin, Stefan
AU - Länzlinger, Tony
AU - Sandu, Cosmin S.
AU - Scartezzini, Jean Louis
AU - Muralt, Paul
PY - 2018/3/30
Y1 - 2018/3/30
N2 - Deposition of nano-composite Mg–F–Si–O films on optical grade silica glass was studied employing RF magnetron co-sputtering from magnesium fluoride (MgF2) and fused silica (SiO2) targets. The aim was to obtain a stable and reliable sputtering process for optical coatings exhibiting a refractive index lower than the one of quartz glass (1.46 at 550 nm) without adding gaseous fluorine to the deposition process. The two magnetrons were installed in a confocal way at 45° off-axis with respect to a static substrate, thus creating a lateral gradient in the thin-film composition. The deposited Mg–F–Si–O coatings were structurally analysed by electron dispersive X-ray spectroscopy (EDX), transmission electron microscopy (TEM) and scanning electron microscopy (SEM). The obtained films consist of MgF2 nanocrystals embedded in a SiO2-rich amorphous matrix. Spectroscopic ellipsometry and spectrophotometry measurements showed that they are highly transparent exhibiting a very-low extinction coefficient k and a refractive index n in the desired range between the one of MgF2 (1.38) and SiO2 (1.46). Films with n = 1.424 and 1.435 at 550 nm were accomplished with absorption below the detection threshold.
AB - Deposition of nano-composite Mg–F–Si–O films on optical grade silica glass was studied employing RF magnetron co-sputtering from magnesium fluoride (MgF2) and fused silica (SiO2) targets. The aim was to obtain a stable and reliable sputtering process for optical coatings exhibiting a refractive index lower than the one of quartz glass (1.46 at 550 nm) without adding gaseous fluorine to the deposition process. The two magnetrons were installed in a confocal way at 45° off-axis with respect to a static substrate, thus creating a lateral gradient in the thin-film composition. The deposited Mg–F–Si–O coatings were structurally analysed by electron dispersive X-ray spectroscopy (EDX), transmission electron microscopy (TEM) and scanning electron microscopy (SEM). The obtained films consist of MgF2 nanocrystals embedded in a SiO2-rich amorphous matrix. Spectroscopic ellipsometry and spectrophotometry measurements showed that they are highly transparent exhibiting a very-low extinction coefficient k and a refractive index n in the desired range between the one of MgF2 (1.38) and SiO2 (1.46). Films with n = 1.424 and 1.435 at 550 nm were accomplished with absorption below the detection threshold.
KW - Low refractive index
KW - Magnesium fluoride
KW - Magnetron co-sputtering
KW - Nano-composites
KW - Optical properties
KW - Thin-film deposition
UR - http://www.scopus.com/inward/record.url?scp=85034628090&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2017.10.229
DO - 10.1016/j.apsusc.2017.10.229
M3 - Article
AN - SCOPUS:85034628090
SN - 0169-4332
VL - 435
SP - 170
EP - 177
JO - Applied Surface Science
JF - Applied Surface Science
ER -