Combined ion micro probe and SEM analysis of strongly non uniform deposits in fusion devices

I. Bykov; H. Bergsåker; P. Petersson; Jari Likonen; G. Possnert; A. Widdowson

doi:10.1016/j.nimb.2014.08.019

Combined ion micro probe and SEM analysis of strongly non uniform deposits in fusion devices

I. Bykov (Corresponding Author), H. Bergsåker, P. Petersson, Jari Likonen, G. Possnert, A. Widdowson

Research output: Contribution to journal › Article › Scientific › peer-review

13 Citations (Scopus)

Abstract

Conventional ion beam analysis (IBA) of deposited layers from fusion devices may have insufficient accuracy due to strongly uneven appearance of the layers. Surface roughness and spatial variation of the matrix composition make interpretation of broad beam spectra complex and non obvious. We discuss complications of applied IBA arising for fusion-relevant surfaces and demonstrate how quantification can be improved by employing micro IBA methods. The analysis is bound to pre-defined regions on the sample surface and can be extended by employing beams of several types, scanning electron microscopy (SEM) and stereo SEM techniques.

Original language	English
Pages (from-to)	19-28
Journal	Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Volume	342
DOIs	https://doi.org/10.1016/j.nimb.2014.08.019
Publication status	Published - 1 Jan 2015
MoE publication type	Not Eligible

Keywords

Deuterium retention
Ion micro probe
Micro NRA
PIXE
Plasma-facing components

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1016/j.nimb.2014.08.019

Cite this

@article{350852e8b40740acb2b6029ca820ade8,

title = "Combined ion micro probe and SEM analysis of strongly non uniform deposits in fusion devices",

abstract = "Conventional ion beam analysis (IBA) of deposited layers from fusion devices may have insufficient accuracy due to strongly uneven appearance of the layers. Surface roughness and spatial variation of the matrix composition make interpretation of broad beam spectra complex and non obvious. We discuss complications of applied IBA arising for fusion-relevant surfaces and demonstrate how quantification can be improved by employing micro IBA methods. The analysis is bound to pre-defined regions on the sample surface and can be extended by employing beams of several types, scanning electron microscopy (SEM) and stereo SEM techniques.",

keywords = "Deuterium retention, Ion micro probe, Micro NRA, PIXE, Plasma-facing components",

author = "I. Bykov and H. Bergs{\aa}ker and P. Petersson and Jari Likonen and G. Possnert and A. Widdowson",

year = "2015",

month = jan,

day = "1",

doi = "10.1016/j.nimb.2014.08.019",

language = "English",

volume = "342",

pages = "19--28",

journal = "Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier",

}

Combined ion micro probe and SEM analysis of strongly non uniform deposits in fusion devices. / Bykov, I. (Corresponding Author); Bergsåker, H.; Petersson, P. et al.
In: Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 342, 01.01.2015, p. 19-28.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Combined ion micro probe and SEM analysis of strongly non uniform deposits in fusion devices

AU - Bykov, I.

AU - Bergsåker, H.

AU - Petersson, P.

AU - Likonen, Jari

AU - Possnert, G.

AU - Widdowson, A.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - Conventional ion beam analysis (IBA) of deposited layers from fusion devices may have insufficient accuracy due to strongly uneven appearance of the layers. Surface roughness and spatial variation of the matrix composition make interpretation of broad beam spectra complex and non obvious. We discuss complications of applied IBA arising for fusion-relevant surfaces and demonstrate how quantification can be improved by employing micro IBA methods. The analysis is bound to pre-defined regions on the sample surface and can be extended by employing beams of several types, scanning electron microscopy (SEM) and stereo SEM techniques.

AB - Conventional ion beam analysis (IBA) of deposited layers from fusion devices may have insufficient accuracy due to strongly uneven appearance of the layers. Surface roughness and spatial variation of the matrix composition make interpretation of broad beam spectra complex and non obvious. We discuss complications of applied IBA arising for fusion-relevant surfaces and demonstrate how quantification can be improved by employing micro IBA methods. The analysis is bound to pre-defined regions on the sample surface and can be extended by employing beams of several types, scanning electron microscopy (SEM) and stereo SEM techniques.

KW - Deuterium retention

KW - Ion micro probe

KW - Micro NRA

KW - PIXE

KW - Plasma-facing components

UR - http://www.scopus.com/inward/record.url?scp=84937641801&partnerID=8YFLogxK

U2 - 10.1016/j.nimb.2014.08.019

DO - 10.1016/j.nimb.2014.08.019

M3 - Article

AN - SCOPUS:84937641801

SN - 0168-583X

VL - 342

SP - 19

EP - 28

JO - Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

ER -

Combined ion micro probe and SEM analysis of strongly non uniform deposits in fusion devices

Abstract

Keywords

UN SDGs

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