Abstract
The MINIMOS modeling capability was extended to lateral double diffused MOS-transistors. With combined use of MINIMOS, SUPREM and a newly developed interface program we have got a helpful tool for designing the technology and device structure of the Insulated Gate Bipolar Transistor. The calculated characteristics of the lateral double diffused MOS-transistor were in acceptable agreement with the measurements.
| Original language | English |
|---|---|
| Pages (from-to) | 131-132 |
| Journal | Physica Scripta |
| Volume | 1990 |
| Issue number | T33 |
| DOIs | |
| Publication status | Published - 1990 |
| MoE publication type | A1 Journal article-refereed |
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