Comparative assessment of LTCC band-pass filters for millimeter-wave applications

Vasily Kondratyev; Markku Lahti; Kari Kautio

doi:10.1109/EUMC.2006.281432

Comparative assessment of LTCC band-pass filters for millimeter-wave applications

Vasily Kondratyev, Markku Lahti, Kari Kautio

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

3 Citations (Scopus)

Abstract

In order to find the planar filter configuration that is the less sensitive to low temperature co-fired ceramic (LTCC) technology errors, several types of filters (square patch filter, triangular patch filter, and staggered array filter) were designed, fabricated and examined in millimeter-waves. Based on measurement results the comparative assessment is given.

Original language	English
Title of host publication	Proceedings of the 36th European Microwave Conference
Subtitle of host publication	Manchester, UK, 11-15 September 2006
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	549-551
ISBN (Print)	2-9600551-6-0
DOIs	https://doi.org/10.1109/EUMC.2006.281432
Publication status	Published - 2006
MoE publication type	A4 Article in a conference publication

Keywords

Ceramics
Dual-mode filters
LTCC
Millimeter-waves

Access to Document

10.1109/EUMC.2006.281432

Cite this

@inproceedings{21ae42ddb1b74687a568c3a1616c87fd,

title = "Comparative assessment of LTCC band-pass filters for millimeter-wave applications",

abstract = "In order to find the planar filter configuration that is the less sensitive to low temperature co-fired ceramic (LTCC) technology errors, several types of filters (square patch filter, triangular patch filter, and staggered array filter) were designed, fabricated and examined in millimeter-waves. Based on measurement results the comparative assessment is given.",

keywords = "Ceramics, Dual-mode filters, LTCC, Millimeter-waves",

author = "Vasily Kondratyev and Markku Lahti and Kari Kautio",

year = "2006",

doi = "10.1109/EUMC.2006.281432",

language = "English",

isbn = "2-9600551-6-0",

pages = "549--551",

booktitle = "Proceedings of the 36th European Microwave Conference",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

}

Comparative assessment of LTCC band-pass filters for millimeter-wave applications. / Kondratyev, Vasily; Lahti, Markku; Kautio, Kari.

Proceedings of the 36th European Microwave Conference: Manchester, UK, 11-15 September 2006. IEEE Institute of Electrical and Electronic Engineers, 2006. p. 549-551.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Comparative assessment of LTCC band-pass filters for millimeter-wave applications

AU - Kondratyev, Vasily

AU - Lahti, Markku

AU - Kautio, Kari

PY - 2006

Y1 - 2006

N2 - In order to find the planar filter configuration that is the less sensitive to low temperature co-fired ceramic (LTCC) technology errors, several types of filters (square patch filter, triangular patch filter, and staggered array filter) were designed, fabricated and examined in millimeter-waves. Based on measurement results the comparative assessment is given.

AB - In order to find the planar filter configuration that is the less sensitive to low temperature co-fired ceramic (LTCC) technology errors, several types of filters (square patch filter, triangular patch filter, and staggered array filter) were designed, fabricated and examined in millimeter-waves. Based on measurement results the comparative assessment is given.

KW - Ceramics

KW - Dual-mode filters

KW - LTCC

KW - Millimeter-waves

U2 - 10.1109/EUMC.2006.281432

DO - 10.1109/EUMC.2006.281432

M3 - Conference article in proceedings

SN - 2-9600551-6-0

SP - 549

EP - 551

BT - Proceedings of the 36th European Microwave Conference

PB - IEEE Institute of Electrical and Electronic Engineers

ER -

Comparative assessment of LTCC band-pass filters for millimeter-wave applications

Abstract

Keywords

Access to Document

Fingerprint

Cite this