Comparing novel small-angle x-ray scattering approaches for absolute size and number concentration measurements of spherical SiO2 particles to established methods

Robin Schürmann*, Anikó Gaál, Aneta Sikora, David Ojeda, Dorota Bartczak, Heidi Goenaga-Infante, Virpi Korpelainen, Bruno Sauvet, Jérôme Deumer, Zoltán Varga, Christian Gollwitzer

*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

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