Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm resistor

A. Satrapinski; H. Seppä; B. Schumacher; P. Warnecke; F. Delahaye; W. Poirier; F. Piquemal

doi:10.1109/19.918111

Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm resistor

A. Satrapinski, H. Seppä, B. Schumacher, P. Warnecke, F. Delahaye, W. Poirier, F. Piquemal

Research output: Contribution to journal › Article › Scientific › peer-review

4 Citations (Scopus)

Abstract

We have carried out a resistance comparison of four QHR systems using a 100-Ohm resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 109 with a relative combined standard uncertainty of ±1*10-8

Original language	English
Pages (from-to)	238-241
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	50
Issue number	2
DOIs	https://doi.org/10.1109/19.918111
Publication status	Published - 2002
MoE publication type	A1 Journal article-refereed

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@article{7c2e1795a27246f687da4d250c08ffd9,

title = "Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm resistor",

abstract = "We have carried out a resistance comparison of four QHR systems using a 100-Ohm resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 109 with a relative combined standard uncertainty of ±1*10-8",

author = "A. Satrapinski and H. Sepp{\"a} and B. Schumacher and P. Warnecke and F. Delahaye and W. Poirier and F. Piquemal",

year = "2002",

doi = "10.1109/19.918111",

language = "English",

volume = "50",

pages = "238--241",

journal = "IEEE Transactions on Instrumentation and Measurement",

issn = "0018-9456",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

number = "2",

}

TY - JOUR

T1 - Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm resistor

AU - Satrapinski, A.

AU - Seppä, H.

AU - Schumacher, B.

AU - Warnecke, P.

AU - Delahaye, F.

AU - Poirier, W.

AU - Piquemal, F.

PY - 2002

Y1 - 2002

N2 - We have carried out a resistance comparison of four QHR systems using a 100-Ohm resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 109 with a relative combined standard uncertainty of ±1*10-8

AB - We have carried out a resistance comparison of four QHR systems using a 100-Ohm resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 109 with a relative combined standard uncertainty of ±1*10-8

U2 - 10.1109/19.918111

DO - 10.1109/19.918111

M3 - Article

VL - 50

SP - 238

EP - 241

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

SN - 0018-9456

IS - 2

ER -

Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm resistor

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