Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 238-241 |
| Journal | IEEE Transactions on Instrumentation and Measurement |
| Volume | 50 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 2002 |
| MoE publication type | A1 Journal article-refereed |
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Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm resistor. / Satrapinski, A.; Seppä, H.; Schumacher, B.; Warnecke, P.; Delahaye, F.; Poirier, W.; Piquemal, F.
In: IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 2, 2002, p. 238-241.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm resistor
AU - Satrapinski, A.
AU - Seppä, H.
AU - Schumacher, B.
AU - Warnecke, P.
AU - Delahaye, F.
AU - Poirier, W.
AU - Piquemal, F.
PY - 2002
Y1 - 2002
N2 - We have carried out a resistance comparison of four QHR systems using a 100-Ohm resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 109 with a relative combined standard uncertainty of ±1*10-8
AB - We have carried out a resistance comparison of four QHR systems using a 100-Ohm resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 109 with a relative combined standard uncertainty of ±1*10-8
U2 - 10.1109/19.918111
DO - 10.1109/19.918111
M3 - Article
VL - 50
SP - 238
EP - 241
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
SN - 0018-9456
IS - 2
ER -