Original language | English |
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Pages (from-to) | 519-520 |
Journal | International Journal of Applied Radiation and Isotopes |
Volume | 32 |
Issue number | 7 |
DOIs | |
Publication status | Published - 1981 |
MoE publication type | A1 Journal article-refereed |
Compensation for specimen curvature effect in coating thickness gauges
Heikki Kumpulainen, S. Lehtola
Research output: Contribution to journal › Article › Scientific › peer-review