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Concentration methods for the detection of trace elements in UPW
Simo Eränen
*
,
Heini Saloniemi
, J. Hintsala
, Ismo Luusua
*
Corresponding author for this work
Okmetic Oyj
Research output
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peer-review
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Keyphrases
X-ray
100%
Silicon Wafer
100%
Trace Impurities
100%
Vaporization
100%
New Alternatives
100%
Decomposition Method
100%
Trace Elements
100%
Metallic Impurities
100%
Ultrapure Water
100%
FaaS
100%
Vapor Phase Decomposition
100%
Concentration Step
100%
Concentration Method
100%
Total Reflection
100%
Metallic Trace
100%
INIS
concentration
100%
detection
100%
impurities
100%
trace elements
100%
x radiation
50%
silicon
50%
water
50%
vapors
50%
graphite
50%
reflection
50%
decomposition
50%
furnaces
50%
vaporization
50%
atomic absorption spectroscopy
50%
Chemistry
Atomic Absorption Spectroscopy
100%
Vaporization
100%
Silicon
100%
Engineering
Pure Water
100%
Vaporization
100%
Silicon Wafer
100%
Material Science
Silicon Wafer
100%
Atomic Absorption Spectroscopy
100%
Chemical Engineering
Trace Element
100%
Inductively Coupled Plasma Mass Spectrometry
100%